Patent
   D744359
Priority
Dec 11 2013
Filed
Jun 03 2014
Issued
Dec 01 2015
Expiry
Dec 01 2029
Assg.orig
Entity
unknown
0
14
n/a
The ornamental design for a micrometer, as shown and described.

FIG. 1 is an upper perspective view of an exemplary micrometer;

FIG. 2 is a front view of the micrometer;

FIG. 3 is a rear view of the micrometer;

FIG. 4 is a bottom view of the micrometer;

FIG. 5 is a top view of the micrometer;

FIG. 6 is a left side view of the micrometer;

FIG. 7 is a front view of another exemplary micrometer, with the other views the same as shown above in connection with FIG. 1; and,

FIG. 8 is a front view of still another exemplary micrometer, with the other view the same as shown above in connection with FIG. 1.

Biselx, Frédéric, Karawa, Stéphane

Patent Priority Assignee Title
Patent Priority Assignee Title
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5495677, Oct 01 1993 STRIDE TOOL, INC Digital display micrometer gauge
5691646, Dec 07 1994 Mitutoya Corporation Capacitance-type displacement measuring device with electrodes having spiral patterns
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6247244, Jul 16 1998 TESA S A Device for longitudinal measurement
6308433, Nov 11 1998 Mitutoyo Corporation Micrometer that holds displayed displacement when retraction amount is less than a set amount
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D263809, Oct 11 1979 Mitutoyo Mfg. Co., Ltd. Micrometer
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Mar 03 2014BISELX, FRÉDÉRICTesa SAASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0330210573 pdf
Mar 03 2014KARAWA, STÉPHANETesa SAASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0330210573 pdf
Jun 03 2014Tesa SA(assignment on the face of the patent)
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