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The ornamental design for a test instrument, as shown and described.
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Patent | Priority | Assignee | Title |
D981257, | Jul 06 2022 | SHENZHEN YINGBOWEIYE TECHNOLOGY CO., LTD. | Thermometer |
ER1436, | |||
ER6013, |
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4600968, | Nov 13 1984 | FUJI ELECTRIC CO , LTD | Semiconductor device package having regions of different thermal properties |
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Nov 05 2014 | VORNBÄUMEN, GERO | DRÄGER SAFETY AG & CO KGAA | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 034441 | 0135 | |
Nov 14 2014 | Dräger Safety AG & co. KGaA | (assignment on the face of the patent) |
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