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Patent
D748509
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Priority
Apr 29 2014
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Filed
Oct 28 2014
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Issued
Feb 02 2016
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Expiry
Feb 02 2030
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Assg.orig
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Entity
unknown
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2
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8
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n/a
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The ornamental design for an analytical measuring instrument, as shown and described.
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FIG. 1 is a front perspective view of the analytical measuring instrument;
FIG. 2 is a top plan view of the FIG. 1 device;
FIG. 3 is a bottom plan view of the FIG. 1 device;
FIG. 4 is a left side elevation view of the FIG. 1 device;
FIG. 5 is a right side elevation view of the FIG. 1 device;
FIG. 6 is a rear elevation view of the FIG. 1 device; and,
FIG. 7 is a front elevation view of the FIG. 1 device.
The broken lines are for illustrating functional features and form no part of the claimed design.
Marmier, Yves, Ammon, Patrick, Liu, Roy, Escalier, Thibault
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