Patent
   D750783
Priority
Feb 19 2014
Filed
Jul 16 2014
Issued
Mar 01 2016
Expiry
Mar 01 2030
Assg.orig
Entity
unknown
2
8
n/a
The ornamental design for a X-ray residual stress measuring instrument, as shown and described.

FIG. 1 is a front elevational view of a X-ray residual stress measuring instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view therefore;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a cross-sectional view thereof, taken along the line 7-7 of FIG. 1;

FIG. 8 is a cross-sectional view thereof, taken along the line 8-8 of FIG. 2;

FIG. 9 is a perspective view thereof; and,

FIG. 10 is a perspective view thereof.

Sasaki, Suguru, Yasukawa, Shoichi

Patent Priority Assignee Title
D798173, Dec 22 2015 Sintokogio, Ltd.; Sintokogio, Ltd Residual stress measuring device
D798753, Dec 22 2015 Sintokogio, Ltd.; Sintokogio, Ltd Residual stress measuring device
Patent Priority Assignee Title
4694480, Jul 30 1985 KEVEX X-RAY INC , A CORP OF CA Hand held precision X-ray source
7515684, Dec 04 2002 X-Ray Optical Systems, Inc. Detection apparatus for x-ray analysis, including semiconductor detectors having uncooled active areas
9146203, Jul 30 2010 Rigaku Corporation X-ray stress measuring apparatus
D371197, Jul 05 1994 X-ray machine
D554754, Sep 01 2004 Hamamatsu Photonics K.K. X-ray device
D628296, Sep 28 2009 Shimadzu Corporation X-ray collimator
D676554, Aug 10 2011 Samsung Electronics Co., Ltd. Medical X-ray collimator
D724214, Aug 27 2013 Shimadzu Corporation Analyzing machine having X-ray
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Jul 02 2014YASUKAWA, SHOICHIRigaku CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0333270357 pdf
Jul 02 2014SASAKI, SUGURURigaku CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0333270357 pdf
Jul 16 2014Rigaku Corporation(assignment on the face of the patent)
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