Patent
   D781162
Priority
Sep 08 2015
Filed
Sep 08 2015
Issued
Mar 14 2017
Expiry
Mar 14 2032
Assg.orig
Entity
unknown
1
5
n/a
The ornamental design for a moisture analyzer, as shown and described.

FIG. 1 is a front perspective view of the moisture analyzer;

FIG. 2 is a rear elevation view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a left-side elevation view thereof;

FIG. 5 is a front elevation view thereof;

FIG. 6 is a right-side elevation view thereof; and,

FIG. 7 is a top plan view thereof.

The broken line showing of a portion of FIG. 2 is for the purpose of illustrating internal portions of the moisture analyzer and forms no part of the claimed design.

Wang, Heqiao

Patent Priority Assignee Title
D946424, Nov 25 2019 SHIZUOKA SEIKI CO , LTD Moisture meter
Patent Priority Assignee Title
6092924, Feb 10 1998 Denver Instrument Company Microwave moisture analyzer: apparatus and method
6247246, May 27 1998 Denver Instrument Company Microwave moisture analyzer: apparatus and method
6320170, Sep 17 1999 Cem Corporation Microwave volatiles analyzer with high efficiency cavity
D256783, Sep 18 1978 Seaman Nuclear Corporation Moisture measuring meter
D438808, Sep 15 1999 SARTORIUS LAB INSTRUMENTS GMBH & CO KG Moisture analyzer
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 08 2015Mettler-Toledo GmbH(assignment on the face of the patent)
Sep 21 2015WANG, HEQIAOMettler-Toledo AGASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0367420950 pdf
Dec 01 2015Mettler-Toledo AGMettler-Toledo GmbHCHANGE OF NAME SEE DOCUMENT FOR DETAILS 0374610960 pdf
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