Patent
   D781734
Priority
Sep 13 2013
Filed
Mar 13 2014
Issued
Mar 21 2017
Expiry
Mar 21 2031
Assg.orig
Entity
unknown
3
7
n/a
I claim, the ornamental design for a sensor for measuring materials, as shown and described.

FIG. 1 is a front perspective view of a sensor for measuring materials, showing my new design;

FIG. 2 is a rear perspective view thereof;

FIG. 3 is a bottom perspective view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a front elevation view thereof;

FIG. 7 is an enlarged partial view of FIG. 6;

FIG. 8 is a rear elevation view thereof;

FIG. 9 is an enlarged partial view of FIG. 8;

FIG. 10 is a side elevation view thereof taken from the right of FIG. 6; and,

FIG. 11 is a side elevation view thereof taken from the left of FIG. 6.

Lim, Wai-Loong

Patent Priority Assignee Title
D798173, Dec 22 2015 Sintokogio, Ltd.; Sintokogio, Ltd Residual stress measuring device
D798753, Dec 22 2015 Sintokogio, Ltd.; Sintokogio, Ltd Residual stress measuring device
D815625, Sep 25 2015 NEXIOT AG Housing for electronic communication devices
Patent Priority Assignee Title
5983701, Jun 13 1997 HASSANI, FERRI P ; SADRI, AFSHIN; MOMAYEZ, MOE Non-destructive evaluation of geological material structures
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Mar 13 2014PROCEQ AG(assignment on the face of the patent)
Jul 07 2014LIM, WAI-LOONGPROCEQ AGASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0337980445 pdf
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