Patent
   D792255
Priority
Nov 12 2015
Filed
May 04 2016
Issued
Jul 18 2017
Expiry
Jul 18 2032
Assg.orig
Entity
unknown
1
2
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof, a rear elevational view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.

The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.

Kondo, Makoto, Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
ER6991,
Patent Priority Assignee Title
6784680, Jun 01 2000 SUMITOMO ELECTRIC INDUSTRIES, LTD Contact probe with guide unit and fabrication method thereof
7190179, Apr 13 2001 SUMITOMO ELECTRIC INDUSTRIES, LTD Contact probe
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Executed onAssignorAssigneeConveyanceFrameReelDoc
May 04 2016Omron Corporation(assignment on the face of the patent)
May 19 2016SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0392070412 pdf
May 20 2016KONDO, MAKOTOOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0392070412 pdf
Jun 06 2016TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0392070412 pdf
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