Plunger for semiconductor chip-testing probe

Abstract

Description

FIG. 1 is a perspective view.

FIG. 2 is a front view.

FIG. 3 is a back view.

FIG. 4 is a left side view.

FIG. 5 is a right side view.

FIG. 6 is a top plan view; and,

FIG. 7 is a bottom plan view.

The present design relates to a plunger that is inserted into a semiconductor chip-testing probe and has a conical-shaped end. The material of the present design is metal.

Claims

The ornamental design for a plunger for semiconductor chip-testing probe, as shown and described.