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Patent
D830208
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Priority
Oct 03 2016
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Filed
Mar 24 2017
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Issued
Oct 09 2018
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Expiry
Oct 09 2033
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Assg.orig
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Entity
unknown
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2
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7
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n/a
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The ornamental design for a probe, as shown and described.
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FIG. 1 is a perspective view of a probe showing my new design;
FIG. 2 is a front view thereof, the rear view being a mirror image thereof;
FIG. 3 is a left side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 is a bottom plan side view thereof.
The drawings include surface shading which represents contour and not surface ornamentation.
The parallel dash-dot-dash broken lines represent a symbolic break in the length of an element of the probe and form no part of the claimed design.
The appearance of any portion of the probe between the break lines forms no part of the claimed design.
Makino, Yoshiyasu
Patent |
Priority |
Assignee |
Title |
20130314084, |
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D431867, |
Mar 22 1999 |
HEALTHCARE FINANCIAL SOLUTIONS, LLC, AS SUCCESSOR ADMINISTRATIVE AGENT |
Immunoassay test device |
D450000, |
Feb 24 2000 |
APPLEJACK 199, L P |
Multiple environment testing chamber |
D571831, |
Jul 29 2005 |
Tokyo Electron Limited |
Top panel for microwave introduction window of a plasma processing apparatus |
D744360, |
Jan 06 2014 |
Sintokogio, Ltd |
Probe for peening inspection |
D808901, |
May 03 2016 |
MEEMOOBABY LTD |
Charging base |
WO9116638, |
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Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a