Patent
   D830866
Priority
Jun 06 2017
Filed
Jun 06 2017
Issued
Oct 16 2018
Expiry
Oct 16 2033
Assg.orig
Entity
unknown
0
15
n/a
The ornamental design for the multiprobe circuit tester, as shown and described.

FIG. 1 is a top perspective view of an embodiment of the multiprobe circuit tester;

FIG. 2 is a first side view of the multiprobe circuit tester;

FIG. 3 is a second side view of the multiprobe circuit tester;

FIG. 4 is a third side view of the multiprobe circuit tester;

FIG. 5 is a fourth side view of the multiprobe circuit tester;

FIG. 6 is a top plan view of the multiprobe circuit tester; and,

FIG. 7 is a bottom plan view of the multiprobe circuit tester.

Any components in the appended drawings shown in broken lines are for illustrative purposes only and form no part of the claimed design or a specified embodiment thereof.

Brekke, David F., Holden, Michael G., Carton, Joshua, Russel, Wayne

Patent Priority Assignee Title
Patent Priority Assignee Title
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Executed onAssignorAssigneeConveyanceFrameReelDoc
May 26 2017BREKKE, DAVIDSnap-On IncorporatedASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0439110071 pdf
Jun 05 2017HOLDEN, MICHAELSnap-On IncorporatedASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0439110071 pdf
Jun 05 2017RUSSEL, WAYNESnap-On IncorporatedASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0439110071 pdf
Jun 05 2017CARTON, JOSHUASnap-On IncorporatedASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0439110071 pdf
Jun 06 2017Snap-On Incorporated(assignment on the face of the patent)
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