Patent
   D838609
Priority
Aug 02 2017
Filed
Sep 13 2017
Issued
Jan 22 2019
Expiry
Jan 22 2034
Assg.orig
Entity
unknown
3
2
n/a
I claim, the ornamental design for an apparatus for detecting particles on test film, as shown and described.

FIG. 1 is a perspective view of an apparatus for detecting particles on test film, showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Kim, Jin Ho

Patent Priority Assignee Title
D858590, Feb 28 2017 MITSUBISHI HEAVY INDUSTRIES MACHINE TOOL CO., LTD. Machine tool
D884708, Mar 05 2018 Samsung Electronics Co., Ltd. Intelligent docking station
D913519, Dec 11 2019 Robert Bosch GmbH Diagnostic device
Patent Priority Assignee Title
9599844, Nov 14 2013 Kabushiki Kaisha Nihon Micronics Inspection apparatus
9983596, Dec 17 2015 Venturedyne, Ltd Environmental sensor and method of operating the same
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Sep 06 2017KIM, JIN HOJEDEX INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0435720844 pdf
Sep 13 2017JEDEX INC.(assignment on the face of the patent)
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