FIG. 1 is a front view of a first embodiment of an electric contact according to the present disclosure.
FIG. 2 is a rear view of the electric contact of FIG. 1.
FIG. 3 is a right side view of the electric contact of FIG. 1.
FIG. 4 is a left side view of the electric contact of FIG. 1.
FIG. 5 is a top view of the electric contact of FIG. 1.
FIG. 6 is a bottom view of the electric contact of FIG. 1.
FIG. 7 is a top front-left perspective view of the electric contact of FIG. 1.
FIG. 8 is a front view of a second embodiment of an electric contact according to the present disclosure.
FIG. 9 is a rear view of the electric contact of FIG. 8.
FIG. 10 is a right side view of the electric contact of FIG. 8.
FIG. 11 is a left side view of the electric contact of FIG. 8.
FIG. 12 is a top view of the electric contact of FIG. 8.
FIG. 13 is a bottom view of the electric contact of FIG. 8; and,
FIG. 14 is a top front-left perspective view of the electric contact of FIG. 8.
This article is an electric contact for testing and inspecting the electric characteristics of semiconductor devices such as semiconductor chips, etc.