A binary map of an object having edges is produced by first producing a digital grey scale image of the object with a given resolution, and processing the grey scale image to produce a binary map of the object at a resolution greater than said given resolution. Processing of the grey scale image includes the step of convolving the 2-dimensional digital grey scale image with a filter function related to the second derivative of a gaussian function forming a 2-dimensional convolved image having signed values. The location of an edge in the object is achieved by finding zero crossings between adjacent oppositely signed values. Preferably, the zero crossings are achieved by an interpolation process that produces a binary bit map of the object at a resolution greater than the resolution of the grey scale image. The nature of the gaussian function whose second derivative is used in the convolution with the grey scale image, namely its standard deviation, is empirically selected in accordance with system noise and the pattern of the traces on the printed circuit board such that the resulting bit map conforms as closely as desired to the lines on the printed circuit board.
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24. Apparatus for detecting an edge of an object comprising:
(a) scan means to scan the object along a scan line that intersects said edge for obtaining a plurality of grey scale level values at discrete sampling points; and
(b) processing means to process said values for locating the intersection of said scan line with said edge such that the location of said intersection at or intermediate said sampling points is generally independent of the relationship between said sampling points and said edge.
35. A method for detecting an edge of an object comprising the steps of:
(a) scanning the object along a scan line that intersects said edge for obtaining a plurality of grey scale level values at discrete sampling points; and
(b) processing the values of the scan line for locating the intersection of said scan line with said edge such that the location of said intersection at or intermediate said sampling points is generally independent of the relationship between said sampling points and said edge.
20. A convolver module for convolving an input stream of data comprising:
a) delay means for delaying said input stream and producing a delayed stream;
b) an adder for adding the input stream to the delayed stream and producing an added stream;
c) a shift register to which the added stream is applied for producing a shifted stream; and
d) means for combining the shifted stream with the added stream and producing an output stream representative of a two-dimensional convolution of the input stream with a boxcar function.
22. A process for producing a binary map of an object having edges comprising:
a) scanning the object to produce a digital grey scale image of the object with a given resolution, said grey scale image having pixels of predetermined size; and
b) processing the grey scale image to produce a digital map of the object having a resolution greater than said given resolution such that the location of edges in the grey scale image digital map are substantially independent of the relationship between the edges of the object and the direction of scanning.
13. A process for increasing the amount of light in a camera producing a binary map of an object having edges comprising:
(a) producing a digital grey scale image of the object by sampling at discrete sampling points, said last mentioned image having a given resolution; and
(b) processing said grey scale image to produce a binary map of the object at a resolution greater than said given resolution, such that the location of edges of the object in the higher resolution map is independent of the location of the edges relative to the sampling points.
12. A process for reducing sensitivity to focusing errors in the binary map of an object having edges comprising:
(a) producing a digital grey scale image of an object by sampling at discrete sampling points, said last mentioned image having a given resolution; and
(b) processing the grey scale image to produce a binary map of the object at a resolution greater than said given resolution, such that the location of edges of the object in the higher resolution map is independent of the location of edges of the object relative to the sampling points.
66. A process for producing a binary map of an object having edges comprising:
(a) sampling the object to obtain grey level values at discrete sampling points for producing a digital grey scale image of the object with a given resolution;
(b) convolving the grey scale image with a filter function to produce a digital map of the object having a resolution greater than said given resolution; and
(c) selecting the filter function such that edges in the digital map corresponding to edges in the object are substantially independent of the location of the sampling points relative to the edges in the object.
41. A process for producing a binary map of an object having edges comprising:
(a) scanning the object in a given direction to obtain grey level values at discrete sampling points for producing a digital grey scale image of the object with a given resolution; and
(b) processing the grey scale image to produce a digital map of the object having a resolution greater than said given resolution, such that the location of an edge of the object in the higher resolution map is independent of the relative location of said edge with respect to the locations of said discrete sampling points, and of the direction of scanning.
50. Apparatus for producing a binary map of an object having edges comprising:
(a) means for scanning the object in a given direction to obtain grey level values at discrete sampling points for producing a digital grey scale image of the object with a given resolution; and
(b) means for processing the grey scale image to produce a digital map of the object having a resolution greater than said given resolution, such that the location of an edge of the object in the higher resolution map is independent of the relative location of said edge with respect to the locations of said discrete sampling points, and of the direction of scanning.
1. A process for producing a binary map of an object having edges comprising:
(a) sampling the object to obtain grey level values at discrete sampling points for producing a digital grey scale image of the object with a given resolution; and
(b) processing the grey scale image to produce a digital map of the object having a resolution greater than said given resolution, such that the location of an edge of the object in the higher resolution map is related by a scale factor to the location of the corresponding edge in the object independently of the relative location of said edge with respect to the locations of said discrete sampling points.
0. 79. A process for analyzing conducting and non-conducting regions on a surface of an electrical circuit comprising:
forming a two dimensional grey scale image of a surface of an electrical circuit, said image having pixels, wherein each pixel corresponds to one of a plurality of elemental areas of a first size on the surface;
processing said two dimensional grey scale image to form a map of said surface, said map including digital map elements representing second elemental areas on the surface, said second elemental areas being smaller than said first elemental areas; and then
employing said map to detect defects in said electrical circuit.
0. 83. A method for automated optical inspection of an electrical circuit, comprising:
producing a digital grey scale image of the electrical circuit with a given gray scale image spatial resolution, said given gray scale image spatial resolution being related to the size of the first elemental areas of said electrical circuit viewed by ones of pixels in an optical detector;
processing the grey scale image to produce a digital map of the electrical circuit, said digital map having a digital map spatial resolution which is greater than said given gray scale image spatial resolution; and
analyzing the digital map to detect defects in said electrical circuit.
0. 97. A method for manufacturing an electrical circuit, comprising:
depositing at least one conductive member on a surface of an electrical circuit substrate;
forming a two-dimensional grey scale image of said surface, said image having pixels, wherein each pixel corresponds to one of a plurality of elemental areas of a first size on the surface;
processing said two dimensional grey scale image to form a map of said surface, said map including digital map elements representing second elemental areas on the surface, said second elemental areas being smaller than said first elemental areas; and then
employing said map to detect defects in said electrical circuit.
0. 98. A method for manufacturing an electrical circuit, comprising:
depositing at least one conductive member on a surface of an electrical circuit substrate;
producing a digital grey scale image of said surface with a given grey scale image spatial resolution, said given grey scale image spatial resolution being related to the size of first elemental areas of said surface viewed by ones of pixels in an optical detector;
processing the grey scale image to produce a digital map of the surface, said digital map having a digital map spatial resolution which is greater than said given grey scale image spatial resolution; and
analyzing the digital map to detect defects in said electrical circuit.
23. Apparatus for producing a binary map of an object having edges comprising:
(a) means for mounting said object so that it is linearly displaceable;
(b) a light source for illuminating said object;
(c) a digital memory;
(d) an electro-optical system responsive to displacement of said object for converting the light therefrom to a grey scale image of the object with a given resolution;
(e) processing means for converting the image in said memory into a binary map of said object having a resolution greater than a given resolution, and having pixels of a predetermined size; and
(f) said processing means being constructed and arranged to cause the relationship between the edges of the pixel of the grey scale image to be independent of the actual edges of the object.
0. 68. A process for producing a map of a surface of an electrical circuit comprising:
forming a two-dimensional grey scale image of a surface of an electrical circuit from data elements acquired by an array of detectors displaced with respect to the surface, wherein ones of said detectors each view corresponding ones of first elemental areas on said surface;
modifying at least some data elements of said two-dimensional grey scale image to provide a plurality of modified data elements; and
forming a map of said electrical circuit from digital map elements that are formed by interpolating between selected modified data elements, wherein said digital map elements correspond to second elemental areas on said surface of the electrical surface that are smaller than said first elemental areas.
0. 94. A method for manufacturing an electrical circuit, comprising:
(a) depositing at least one conductive member on a surface of an electrical circuit substrate;
(b) sampling the substrate to obtain grey level values at discrete sampling points for producing a digital grey scale image of the substrate with a given resolution;
(c) processing the grey scale image to produce a digital map of the substrate having a resolution greater than said given resolution, such that the location of an edge on the substrate in the higher resolution map is related by a scale factor to the location of the corresponding edge on the object independently of the relative location of said edge with respect to the locations of said discrete sampling points; and
(d) analyzing said digital map to detect defects in said electrical circuit substrate.
67. Apparatus for producing a binary map of an object having edges comprising:
(a) means for mounting said object so that it is linearly displaceable;
(b) a light source for illuminating said object;
(c) a digital memory;
(d) an electro-optical system responsive to displacement of said object for sampling the light therefrom at discrete sampling points for producing a grey scale image of the object with a given resolution;
(e) means for storing said grey scale image in said memory; and
(f) means for convolving the image in said memory with a filter function to produce a binary map of said object having a resolution greater than said given resolution, said filter function causing edges in the binary map corresponding to edges in the object to be substantially independent of the location of the sample points relative to the edges in the object.
45. A process for producing a binary map of an object having edges, the process comprising:
a) displacing the object relative to a linear array of photosensitive detectors each of which produces an output that is functionally related to the brightness of the field viewed by the detector;
b) applying the output of the detectors to a memory for storing, in the cells thereof, a two-dimensional digital grey scale image of the object, said image having a predetermined pixel size;
c) convolving the stored image with a filter function that approximates the second derivative of a gaussian function for producing a convolved digital image having a signed value for each cell of said memory;
d) interpolating between adjacent values of opposite sign for obtaining a binary bit map of said object with a pixel size smaller than said predetermined size; and
e) storing said binary bit map in a memory.
0. 96. A method for manufacturing an electrical circuit, comprising:
depositing at least one conductive member on a surface of an electrical circuit substrate;
forming a two-dimensional grey scale image of said surface from data elements acquired by an array of detectors displaced with respect to the surface, wherein ones of said detectors each view corresponding ones of first elemental areas on said surface;
modifying at least some data elements of said two-dimensional grey scale image to provide a plurality of modified data elements;
forming a map of said electrical circuit from digital map elements that are formed by interpolating between selected modified data elements, wherein said digital map elements correspond to second elemental areas on said surface of the electrical circuit that are smaller than said first elemental areas; and
analyzing said map to detect defects in said electrical circuit substrate.
59. A process for producing a binary map of an object having edges, the process comprising:
a) effecting relative displacement between said object and a linear array of photosensitive detectors, each of which produces an output that is functionally related to the brightness of the field viewed by the detector;
b) applying the output of the detectors to a memory having cells for storing, in the cells thereof, a two-dimensional digital grey scale image of the printed circuit board, said image having a predetermined pixel size;
c) convolving the stored image with a filter function that approximates the second derivative of a gaussian function for producing a convolved digital image having a signed value for each cell of said memory;
d) interpolating between adjacent values of opposite sign for obtaining a binary bit map of said object with a pixel size smaller than said predetermined size; and
e) storing said binary bit map in a memory.
9. Apparatus for producing a binary map of an object having edges comprising:
(a) means for mounting said object so that it is linearly displaceable;
(b) a light source for illuminating said object;
(c) a digital memory;
(d) an electro-optical system responsive to displacement of said object for sampling the light therefrom at discrete sampling points for producing a grey scale image of the object with a given resolution;
(e) means for storing said grey scale image in said memory; and
(f) processing means for converting the image in said memory into a binary map of said object having a resolution greater than said given resolution, said processing means being constructed and arranged to cause the location of edges of the object in the higher resolution map to be related by a scale factor to the location of the corresponding edges in the object independently of the relative locations of the edges of the object with respect to said discrete sampling points.
54. Apparatus for producing a binary map of inspecting an object having edges comprising:
a) a linear array of photosensitive detectors each of which produces an output that is functionally related to the brightness of the field a corresponding elemental area on the object viewed by the detector, wherein said elemental areas are a predetermined elemental area size;
b) means for relatively displacing the object and the array;
c) means for applying the output of the detectors to a memory for storing, in the cells thereof, a two-dimensional digital grey gray scale image of the object, said image comprising pixels having a predetermined pixel size;
d) means for convolving the stored image with a filter function that approximates the second derivative of a gaussian function for producing a convolved digital image having a signed value for each cell of said memory;
d) interpolating between adjacent values of opposite sign circuitry for obtaining a binary bit map of said object with a pixel size from said two dimensional digital gray scale image, said map being formed of digital map elements, wherein each digital map element is associated with a corresponding portion of said electrical circuit and at least some non-adjacent portions are separated by a distance that is smaller than said predetermined elemental area size; and
e) a memory for storing said binary bit map processing circuitry employing said map to detect defects in said electrical circuit.
0. 95. A method for manufacturing an electrical circuit, comprising:
(a) depositing at least one conductive member on a surface of an electrical circuit substrate;
(b) displacing the electrical circuit substrate relative to a linear array of photosensitive detectors, each of which produces an output that is functionally related to the brightness of an elemental area of the electrical circuit substrate viewed by the detector, each elemental area being associated with a measured data point and each said measured data point being mutually spaced apart generally by a predetermined sampling distance;
(c) applying the output of the detectors to a memory having cells for storing, in the cells thereof, a two dimensional digital grey scale image of the electrical circuit substrate, said image having pixels corresponding to said measured data points;
(d) obtaining from said two dimensional digital grey scale image a map of said electrical circuit substrate, said map formed of digital map elements, wherein at least some non-adjacent digital map elements represent portions of the electrical circuit that are separated by a distance that is smaller than said predetermined sampling distance; and
(e) employing said map to detect defects in said electrical circuit.
5. A process for producing a binary map of a printed inspecting an electrical circuit board having conductive traces on a surface of a substrate, the processing comprising:
a) linearly displacing the printed electrical circuit board in a direction perpendicular relative to a linear array of photosensitive detectors, each of which produces an output that is functionally related to the brightness of the field an elemental area of the electrical circuit viewed by the detector, each elemental area being associated with a measured data point and each said measured data point being mutually spaced apart generally by a predetermined sampling distance;
b) applying the output of the detectors to a memory having cells for storing, in the cells thereof, a two-dimensional digital grey gray scale image of the printed electrical circuit board , said image having a predetermined pixels size corresponding to said measured data points;
a) convolving the stored image with a two-dimensional, Laplacian of a gaussian function for producing a convolved digital image having a signed value for each cell of said memory;
d c) interpolating between adjacent values of opposite sign for obtaining from said two dimensional digital gray scale image a binary bit map of said printed electrical circuit board with a pixel size , said map formed of digital map elements, wherein at least some non-adjacent digital map elements represent portions of the electrical circuit that are separated by a distance that is smaller than said predetermined size sampling distance; and
e) storing said binary bit map in a memory d) employing said map to detect defects in said electrical circuit.
56. Apparatus for producing a binary map of an object having edges comprising:
a) a light source for illuminating said object;
b) an electro-optical system for sampling light from said object;
c) means for effecting relative movement between said object and said system;
d) means responsive to said relative movement for sampling light from discrete sampling points on the object and producing a grey scale image of the object with a given resolution;
e) means for storing said grey scale image in a digital memory; and
f) processing means for converting the image in said memory into a binary map of said object having a resolution greater than said given resolution, said processing means being constructed and arranged to cause the location of the edges of the object in the higher resolution map to be related by a scale factor to the location of the corresponding edges in the object independently of the relative locations of the edges of the object with respect to said discrete sampling points;
g) wherein said electro-optical system produces a stream of data representative of a scanned two-dimensional grey-scale image of said object, and said processing means includes a convolver, and means for applying said stream serially to said convolver which is responsive to produce a two-dimensional convolution of the grey-scale image.
14. Apparatus for producing a binary map of an object having edges comprising:
(a) means for mounting said object so that it is linearly displaceable;
(b) a light source for illuminating said object;
(c) a digital memory;
(d) an electro-optical system responsive to displacement of said object for sampling the light therefrom at discrete sampling points for producing a grey scale image of the object with a given resolution;
(e) means for storing said grey scale image in said memory; and
(f) processing means for converting the image in said memory into a binary map of said object having a resolution greater than said given resolution, said processing means being constructed and arranged to cause the location of edges of the object in the higher resolution map to be related by a scale factor to the location of the corresponding edges in the object independently of the relative locations of the edges of the object with respect to said discrete sampling points;
(g) wherein said electro-optical system is constructed and arranged to produce a stream of data representative of a scanned two-dimensional grey-scale image of the object, and said processing means includes a plurality of convolver modules, and means for applying said stream serially to said modules which are constructed and arranged to produce a two-dimensional convolution of the grey-scale image.
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0. 69. The invention of
0. 70. The invention of
linearly displacing said electrical circuit in a direction generally perpendicular to said array of detectors; and
applying the output of said detectors to a memory having cells for storing, in the cells thereof, said grey scale image.
0. 71. The invention of
convolving said two-dimensional grey scale image.
0. 72. The invention of
convolving said two-dimensional grey scale image with an approximation of a gaussian function.
0. 73. The invention of
convolving said two-dimensional grey scale image with a two-dimensional, Laplacian of a gaussian function.
0. 74. The invention of
forming a convolved image having a signed value for each element of said image.
0. 75. The invention of
interpolating between adjacent elements of opposite sign.
0. 76. The invention of
0. 77. The invention of
selecting elements for modification which appear to be related to portions of the two-dimensional grey scale image representing boundaries between conducting and non-conducting regions of said electrical circuit; and
modifying said selected elements in accordance with elements adjacent thereto representing said conducting and non-conducting regions.
0. 78. The invention of
spatially locating said boundaries between said conducting and non-conducting regions within one or more of said first elemental areas.
0. 80. The invention of
modifying a value associated with at least some pixels of said two-dimensional grey scale image.
0. 81. The invention of
modifying a value associated with at least some pixels of said two-dimensional grey scale image in accordance with values associated with other pixels located in said two-dimensional grey scale image.
0. 82. The invention of
interpolating between values of at least some adjacent pixels of said two-dimensional gray scale image.
0. 84. A method for inspecting an electrical circuit according to
0. 85. A method for inspecting an electrical circuit according to
0. 86. A method for inspecting an electrical circuit according to
0. 87. A method for inspecting an electrical circuit according to
0. 88. A method for inspecting an electrical circuit according to
0. 89. A method for inspecting an electrical circuit according to
0. 90. A method for inspecting an electrical circuit according to
0. 91. A method for inspecting an electrical circuit according to
0. 92. A method for inspecting an electrical circuit according to
measuring at least one distance in said digital map.
0. 93. A method for inspecting an electrical circuit according to
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where where the quantity A represents the magnitude of the convolved image at 54, B represents the magnitude of the convolved image at data point 53, a represents the dimension of a pixel, and b represents the distance of the zero crossing from data point 54. The object of this exercise is to assign a binary value to bits associated with data points 53 and 54, as well as the two interpolated data points 58 and 59. The binary values for data points 54 and 53 are known and they are ZERO and ONE respectively as shown in FIG. 7. What is unknown is the value associated with the interpolatad interpolated data points 58 and 59, these values being indicated by the quantities x1 and x2. By inspection of Eq. (1), one an can see that if b lies within the interval between zero and a as shown in
Below curve 56 in
In actual practice, a two-dimensional covolution convolution of the grey scale image with a two-dimensional second derivative (Laplacian) of a Gaussian is carried out. The result is a two-dimensional convolved image of signed values; an interpolation is carried on this convolved image as indicated in
Returning now to
As indicated previously, the signed values of the convolved image are different from essentially zero only adjacent transitions or edges in the object image. No information is contained in the convolved image by which a determination can be made that a pixel containing an essentially zero value is derived from a pixel associated with the substrate or from a pixel associated with a line. Thus, the edges of lines can be accurately determined by the process and apparatus described above, but the attribute of pixels remote from an edge (e.g., pixels farther than the radius of the derivative of the Gaussian operator) is unknown. The purpose of pre-processor 70 is to furnish an attribute to interpolator 65 to enable it to assign a binary value to each bit of the bit map in accordance with whether its corresponding pixel is located in a line or in the substrate. Thus, pre-processor 70 applies to each pixel in the grey scale image a threshold test and stores in associated memory 71 a record that indicates whether the threshold is exceeded. The threshold will be exceeded only for pixels located in a line on the printed circuit board. When convolver 47 produces the convolved image of the grey scale image of the board, the addresses of each pixel lying in a line on the board is available from memory 71. Thus, the attribute of each pixel in the bit map can be established. It is determined directly by the convolution sign near a zero-crossing, and by the threshold test farther away from the zero-crossing. This is because unavoidable variations in contrast which always exist cause the threshold test to be inaccurate. This is particularly true near an edge transition where large variations in contrast exist. In the method described here, therefore, the threshold test is used for only for pixels completely surrounded by dark or light areas. The attributes of pixels near the transition are determined, on the other hand, directly by the convolution sign.
The present invention also contemplates determining whether any line on the board has a portion with a thickness less than a predetermined vlaue value, regardless of the orientation of the line relative to the axes defining the pixel orientation. This result is achieved in the manner illustrated in
In practice, analysis of line width can be carried out automatically by sequentially applying the principles set forth above to each point on the edge of a line. A record can be made of each pixel in the bit map at which a ZERO detection occurs in the offset addresses, and hence the coordinates of each point on the board having too narrow a line can be determined and stored. It should be noted that the technique disclosed herein is applicable to any line on the board at any orientation.
The principles described above are equally applicable to determining whether the spacing between lines is less than a predetermined minimum. In this case, however, the imaginary circle is placed at at edge of a line such that it overlies the substrate, and the presence of a ONE in the offset addresses indicates reduced spacing.
The convolution function used in the present invention need not be a 2-dimensional function, and the convolution operation need not be carried out in one step. Rather, the function may be the difference of Gaussian functions, one that is positive, and one that is negative. The convolution operation can be carried out in two steps: convolving with the positive Gaussian function, and then convolving with the negative. Implementing this, the effect of convolution can be achieved by multiple convolving a line of data in the grey scale image with a boxcar function in one dimension, and then convolving the 1-dimensional convolved image with a boxcar function in an orthogonal direction.
In order to facilitate two dimensional filtering, or the convolution operation as described above, apparatus 100 shown in
The operation of apparatus 100 is based on a mathematical theorem that states that a 1-dimensional convolution of a given function with a Gaussian function can be closely approximated by multiple 1-dimensional convolutions of the given function with a boxcar function (i.e., a function that is unity between prescribed limits and zero elsewhere). This procedure is described in Bracewell, R.N. The Fourier Transform and Its Applications, McGraw-Hill Inc., 1978, chapter 8. Application of this theorem and its implementation to the grey-scale image of the board is achieved in the present invention by apparatus 100 which comprises a plurality of identical convolver unit modules, only one of which (designated by numeral 101) is shown in detail. Each module accepts a stream of values from a scanned two dimensional function, and performs a partial filtering operation. The output of that module is then fed to the next module for further filtering.
Each module contains a shift register made of many (e.g., 2048) cells which are fed sequentially with a stream of grey level values from the camera. Under control of pulses from a clock (not shown), the contents of each cell is shifted (to the right as seen in
Another embodiment of convolver, shown in
The horizontal block of apparatus 110 contains m units, each of which performs partial horizontal filtering or convolution. Two adjacent samples in cells 112 and 113 are summed by adder 114 which represent here the boxcar function. The output of the adder is fed into output cell 115. Cascading many horizontal units performs a 1-dimensional horizontal filtering. The output of the horizontal block is then fed into the vertical block.
The vertical block is made of identical units, each of which performs partial vertical filtering. Apparatus 116 shows one vertical unit. The signal is fed into the input cell 117. The output of that cell is down shifted along the shift register 118. Adder 119 adds the output of the shift register and the output of cell 117. The output of module 116 is fed into the input of the next module. The vertical modules perform a 1-dimensional convolution on the output of the horizontal module, completing in this manner a 2-dimensional convolution on the grey-scale image. All memory cells in the vertical or horizontal units as well as all shift registers are pulsed by a common clock (not shown) feeding the value of each cell into the adjacent cell.
While the above described apparatus performs repeating convolutions with a boxcar function comprised of two adjacent pixels, the convolutions can be achieved using a boxcar function comprising more than two adjacent pixels. This can be achieved, for example, by increasing the number of sampling cells and the number of shift registers, and consequently also increasing the number of inputs entering the adders per module.
As previously indicated, the convolution process requires a 2-dimensional convolution with the differences between Gaussian functions and this can be achieved in the manner indicated in
Finally, while the invention has been described in detail with reference to optical scanning of printed circuit boards, the inventive concept is applicable to other optical scanning problems, and more generally, to any 2-dimensional convolution problem. For example, the invention can be applied to inspecting hybrid boards as well as integrated circuits.
The advantages and improved results furnished by the method and apparatus of the present invention are apparent from the foregoing description of the preferred embodiment of the invention. Various changes and modifications may be made without departing from the spirit and scope of the invention as described in the claims that follow.
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