A programmable frequency receiver includes a slicer for receiving data at a first frequency, a de-multiplexer for de-multiplexing the data at a second frequency, a programmable clock generator for generating a clock at the first frequency, and first and second resonant clock amplifiers for amplifying clock signals at the first and second frequencies. The resonant clock amplifiers include an inductor having a low Q value, allowing them to amplify clock signals over the programmable frequency range of the receiver. The second resonant clock amplifier includes digitally tunable delay elements to delay and center the amplified clock signal of the second frequency in the data window at the interface between the slicer and the de-multiplexer. The delay elements can be capacitors. A calibration circuit adjusts capacitive elements within a master clock generator to generate a master clock at the first frequency.
|
16. A device comprising:
a clock circuit comprising amplifiers, at least one of the amplifiers being a resonant amplifier, the clock circuit being configured to produce amplified clock signals derived from a source clock signal, wherein the amplified clock signals comprise at least one amplified and programmably delayed clock signal;
a first circuit configured to multiplex a plurality of data signals using a first amplified clock signal produced by the clock circuit to generate a multiplexed data signal, the first amplified clock signal having a first frequency; and
a second circuit configured to latch the multiplexed data signal using a second amplified clock signal produced by the clock circuit independently of the first amplified clock signal, the second amplified clock signal having a second frequency.
19. A method comprising:
latching an input data stream at a first circuit driven by a first amplified clock signal produced by a first resonant amplifier amplifying a first clock signal derived from a clock source at a first frequency;
receiving the input data stream latched by the first circuit at a second circuit driven by at least a second amplified clock signal produced by a second resonant amplifier amplifying a second clock signal derived from the clock source at a second frequency that is less than the first frequency, wherein the at least one of the first or second resonant amplifiers is configured to amplify and programmably delay the first or second clock signals, respectively; and
programmably adjusting a delay of the first or second clock signals when a source frequency of the clock source changes.
1. A device comprising:
a clock circuit comprising amplifiers, at least one of the amplifiers being a resonant amplifier, the clock circuit being configured to produce amplified clock signals derived from a source clock signal, wherein the amplified clock signals comprise at least one amplified and programmably delayed clock signal;
a first circuit configured to latch an input data stream using a first amplified clock signal produced by the clock circuit, the first amplified clock signal having a first frequency; and
a second circuit that is electrically coupled to the first circuit, the second circuit configured to demultiplex the data stream latched by the first circuit using at least a second amplified clock signal produced by the clock circuit, the second amplified clock signal having a second frequency that is less than the first frequency.
2. The device of
3. The device of
4. The device of
5. The device of
6. The device of
7. The device of
8. The device of
a calibration circuit that is configured to generate the analog control signal.
9. The device of
a clock and data recovery (CDR) circuit that is configured to adjust a phase of the first amplified clock signal.
10. The device of
11. The device of
an input pair of transistors, each having a source, a gate, and a drain, wherein the sources of the input pair of transistors are coupled to each other and to ground, the gates are configured to receive an input clock signal at the second frequency that less than the first frequency, and the drains are configured to output the second amplified clock signal to drive a capacitive load;
an inductor coupled between the drains of the of the input transistors; and
a resistor, coupled between the inductor and a power supply.
12. The device of
a first pair of delay elements, coupled to the drains of the input pair of transistors by a respective first pair of coupling transistors and configured to delay output of the amplified clock signal when the first pair of coupling transistors receive a control signal to couple the first pair of delay elements to the drains of the input pair of transistors.
13. The device of
14. The device of
a second pair of delay elements, coupled to the drains of the input pair of transistors by a respective second pair of coupling transistors and configured to independently delay output of the second amplified clock signal when the second pair of coupling transistors receive the control signal to couple the second pair of delay elements to the drains of the input pair of transistors.
15. The device of
18. The device of
|
This application is a continuation of U.S. patent application Ser. No. 13/094,484, filed Apr. 26, 2011, entitled “Resonant Clock Amplifier with a Digitally Tunable Delay,” now issued as U.S. Pat. No. 8,611,379, which claims priority to U.S. Provisional application Ser. No. 61/375,670, filed on Aug. 20, 2010, entitled “A Resonant Clock Amplifier With a Digitally Tunable Delay,” both of which are hereby incorporated by reference in their entirety.
This application relates to resonant clock amplifiers having a digitally tunable delay, and to receivers having clocks that are distributed using resonant clock amplifiers having digitally tunable delays.
Receivers that receive data transmitted over high-speed serial links typically latch the incoming data using a slicer circuit that is driven by a clock running at either the full rate or half the rate of the incoming data stream. The latched data is then de-multiplexed in a de-multiplexer circuit that is driven by a clock running at a sub-multiple of the latching frequency. Typically, the same clock generating circuitry is used to generate both the latching and de-multiplexing clock signals, and these signals must be amplified to drive the substantial capacitive loads within the receiver. Typically, shunt-peaked amplifiers are used for this purpose.
A significant draw-back to the clock distribution scheme shown in
As shown in
Frequency programmable receiver 100 also includes a clock and data recovery (CDR) circuit 190. Like the calibration block 160, CDR circuit 190 can be internal or external to PLL 110. In operation, CDR circuit 190 adjusts the phase of clock signal 102 so that amplified clock signal 102b is centered on the bit windows of data stream 101 at slicer 130. This ensures the correct latching of data bits in data stream 101 at slicer 130. By design, when receiver 100 is programmed to operate at its highest programmable frequency and CDR circuit 190 has centered amplified clock signal 102b on the bit windows of data stream 101 at slicer 130, amplified clock signal 104b is also centered on the bit windows of latched data stream 101b at de-multiplexer 170. When receiver 100 is programmed to operate at a lower frequency, CDR circuit 190 will generally re-adjust the phase of clock signal 102 to ensure that amplified clock signal 102b remains centered on the bit windows of data stream 101 at slicer 130. However, this re-adjustment can cause the misalignment of amplified clock signal 104b with respect to the bit windows of data stream 101b at de-multiplexer 170. To prevent this, the clock amplifiers 120 and 122, slicer 130, and latches 112/114 in receiver 100 are designed so that they introduce approximately equal delays into the clock signals 102b and 104b over the programmable frequency range of receiver 100. Since clock amplifier 120 amplifies a clock signal 102 that is twice the frequency of the clock signal 104 that is amplified by clock amplifier 122, this generally requires that the delays introduced by clock amplifiers 120 and 122 be essentially frequency independent over the programmable frequency range of receiver 100. While shunt-peaked amplifiers introduce such frequency independent delays, resonant clock amplifiers do not. Consequently, receiver 100 is designed to use shunt peaked amplifiers, despite the power savings that can be achieved using resonant clock amplifiers.
A resonant clock amplifier with a digitally tunable delay, a receiver having a distributed clock signal that is amplified by a resonant clock amplifier with a digitally tunable delay, and a transmitter having a distributed clock signal that is amplified by a resonant clock amplifier with a digital tunable delay, substantially as shown and/or described in connection with at least one of the figures below, and as set forth more fully in the claims.
The resonant clock amplifier 200 works as follows. Inductor 204 and capacitive loads 105 together constitute an LC-tank oscillator with a natural or resonant frequency of ω0=square root(LC), where L is the inductance of inductor 204 and C is the capacitance of capacitive loads 105. A differential clock signal 102+/102− drives the gates of the transistors 202 and 203 to periodically inject power from the power supply into the LC-tank oscillator. The injected power compensates for resistive losses within the LC-tank oscillator, thereby allowing the resonant clock amplifier 200 to achieve sustained oscillation at the driving frequency of the input clock signal 102+/102−.
To ensure resonant clock amplifier 200 has sufficient bandwidth to amplify any input clock signal 102+/102− within a programmable frequency range, the inductance L of inductor 204 is chosen so that the natural frequency of resonant clock amplifier 200 lies in the middle of that programmable frequency range, while the resistance of inductor 204 is chosen so that the gain or response of resonant clock amplifier 200 is appreciable over the entire programmable frequency range. This can be done by choosing an inductor 204 having a low Q or quality factor (i.e., a low ratio of reactance to resistance). The quality factor of inductor 204 thus determines the bandwidth or range of frequencies over which resonant clock amplifier 200 can produce an amplified differential clock signal 102b+/102b− from an input differential clock signal 102+/102−. To achieve sufficient bandwidth, an inductor 204 having a relatively poor quality factor is chosen. The frequency response or bandwidth of resonant clock amplifier 200 is described below in reference to
As shown in
In general, when resonant clock amplifier 200 amplifies an input clock signal of a given frequency (and therefore of a given period T), the phase shift dT between the input clock signal and the output clock signal is proportional to the period. Thus, if a first resonant clock amplifier 200 amplified a first clock signal having a first period T (e.g., clock signal 102 shown in
As shown in
However, as shown in
According to an example implementation of receiver 400, PLL 110 may generate a variable frequency clock signal. A phase adjustment circuit 411 may be provided to adjust the phase of the clock signal output by PLL 110. Phase adjustment circuit 411 is coupled to an output of PLL 110 and to CDR 190. CDR 190 may control phase adjustment circuit 411 to (e.g., continuously) position (or control) the phase of the amplified clock signal 102b to be approximately centered within the data window of the input data stream 101 that is input to slicer circuit 130. In an example implementation, phase adjustment circuit 411 may be provided or implemented as a phase interpolator.
In an alternative implementation, CDR 190 may receive (as inputs) the demultiplexed data output from demultiplexer 170, rather than receive (as inputs) the data output from slicer circuit 130.
As shown in
The one or more programmable (or selectable) delay elements provided within resonant clock amplifier 500 may be provided as one or more switchable capacitors, or multiple switchable capacitors, which may be controlled or selected in a discrete manner. Alternatively, the programmable delay elements may be provided as one or more varactors (variable capacitance devices), which may be controlled in a continuous manner. For example, in another example implementations, both of these techniques (switched capacitors and varactors) may be combined, e.g., where coarse programmable delay (or programmable capacitance) is controlled by selecting one or more switchable capacitors and fine programmable delay (or a fine programmable capacitance) is controlled or adjusted using analog control input to one or more varactors. These are merely a few example implementations, and other devices and implementations may be used to provide a programmable delay element(s).
The programmable delay element(s) may be provided in either resonant clock amplifier or both amplifiers. Thus, in one example implementation, the programmable delay elements are provided within resonant clock amplifier 500. However, in another example implementation, programmable delay elements may be provided within resonant clock amplifier 200.
In addition, adding capacitance (or capacitive delay) to a resonant amplifier (such as to a low-Q or low-quality resonant clock amplifier) can impact the signal amplitude of signals amplified and output by such resonant amplifier. As noted above, capacitance may be provided within one of the resonant clock amplifiers to compensate for a difference in delays caused by two resonant clock amplifiers or two clock paths. In one example embodiment, the programmable delay elements may be added to a resonant clock amplifier that is part of a lower frequency clock path because the impact (e.g., decrease) in clock signal amplitude due to the added capacitance may typically be less for a lower frequency signal. Therefore, according to an example implementation, programmable delay elements (e.g., switchable capacitors and/or varactors) may be added to or provided within resonant clock amplifier 500 that generates a clock signal 104b that may be a lower frequency as compared to the clock signal 102b in the signal path of resonant clock amplifier 200. Thus, it may be advantageous (at least in some cases) to provide programmable delay elements in the low (or lower) frequency clock path, e.g., for clock 104b.
As shown in
As shown in
Referring back to
Referring again to
While certain features of the programmable delay resonant clock amplifier and the frequency programmable receiver with programmable delay resonant clock amplifiers have been illustrated as described herein, many modifications, substitutions, changes and equivalents will occur to those skilled in the art. For example, the programmable delay resonant clock amplifier 500 can include additional delay elements that can be switchably connected to the core resonant clock amplifier 200 via additional control lines. The additional delay elements can be used to increase the programmable delay of resonant clock amplifier 500 or to more finely tune the programmable delay of resonant clock amplifier 500. The delay elements can be one or more switchable capacitors such as capacitors 504 and 505 controlled discretely using digital control signals, or other types of continuous delay elements constructed using variable capacitance elements such as varactors controlled by an analog control signal or by a combination of discrete and continuous capacitance control. The control signals that are used to determine the programmable delay of resonant clock amplifier 500 can be derived from a control element other than calibration logic 160. For example, resonant clock amplifier 500 can have its own delay calibration logic, which can be, for example, an independent lookup table that is indexed by the control signals 108 that program the frequency of receiver 400. The indexed elements of the independent lookup table can store the control signals that are needed to programmable the delay in resonant clock amplifier 500.
The receiver 400 shown in
A first amplified clock signal is generated by resonant clock amplifier 500 and output onto line 615, and input as a select line into MUX 610. Resonant clock amplifier 500 has a programmable delay element, as described above. MUX circuit 610 multiplexes or combines the two (or multiple) data inputs at times or at a rate determined by the first amplified clock signal output from resonant clock amplifier. The multiplexed data signal is output from MUX circuit 610 via line 614 to flip-flop (or other memory element or another multiplexer) 620. The resonant clock amplifier 500 amplifies a first clock signal at a first programmable frequency.
Flip-flop (or other memory element or another multiplexer) 620 may latch the multiplexed data signal output from MUX circuit 610 at times or at a rate determined by a second amplified clock signal received via line 617 that was produced by resonant clock amplifier 200. As noted above, the resonant clock amplifier 200 amplifies a second clock signal at a second programmable frequency that is a multiple of the first programmable frequency (e.g., the second frequency may be 2×, 3×, 4×, . . . N× . . . etc., the first programmable frequency). As noted above, resonant clock amplifier 500 may include one or more programmable delay elements to delay the amplified clock signals to compensate for a frequency dependent time delay introduced between the first and second amplified clock signals by the first and second resonant clock amplifiers (200, 500), according to an example implementation.
While the various circuits described herein have been shown and described as differential circuits, it will apparent to one of skill in the art that the circuits described can also be implemented as single ended circuits.
It is to be understood that these, and other such changes and modifications that would be familiar to a person of ordinary skill in the art, fall within the scope of the appended claims, which are intended to cover all such modifications and embodiments.
Cao, Jun, Momtaz, Afshin, Raghavan, Bharath
Patent | Priority | Assignee | Title |
10141915, | Aug 07 2015 | International Business Machines Corporation | Sequenced pulse-width adjustment in a resonant clocking circuit |
Patent | Priority | Assignee | Title |
5430393, | May 10 1993 | Motorola, Inc. | Integrated circuit with a low-power mode and clock amplifier circuit for same |
5892797, | Jul 15 1997 | Jay, Deng | System and method for recovering data encoded using manchester code and other bi-phase level codes |
5999027, | Jun 13 1995 | Fujitsu Limited | Phase compensating apparatus and delay controlling circuit |
6346830, | Jan 06 1999 | NEC Electronics Corporation | Data input/output circuit and interface system using the same |
6769082, | Mar 15 1999 | Advantest Corporation | Delay device, semiconductor testing device, semiconductor device, and oscilloscope |
6867630, | Aug 31 2001 | SK HYNIX INC | Clock processing logic and method for determining clock signal characteristics in reference voltage and temperature varying environments |
6924685, | Dec 21 2002 | Hynix Semiconductor, Inc. | Device for controlling a setup/hold time of an input signal |
7075347, | Aug 10 2000 | University of Southern California | Multiphase resonant pulse generators |
7078951, | Aug 27 2004 | U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT | System and method for reduced power open-loop synthesis of output clock signals having a selected phase relative to an input clock signal |
7106655, | Dec 29 2004 | U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT | Multi-phase clock signal generator and method having inherently unlimited frequency capability |
7145408, | Jan 11 2002 | TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK, THE | Resonant clock distribution for very large scale integrated circuits |
7579905, | Mar 05 2007 | Intel Corporation | Reduced jitter amplification methods and apparatuses |
7917042, | Jun 29 2007 | Alcatel-Lucent USA Inc | High speed optoelectronic receiver |
8229367, | Apr 14 2009 | Qualcomm Incorporated | Low noise amplifier with combined input matching, balun, and transmit/receive switch |
8611379, | Aug 20 2010 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Resonant clock amplifier with a digitally tunable delay |
20030179783, | |||
20090096525, | |||
20090128210, | |||
20090154937, |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Apr 04 2011 | MOMTAZ, AFSHIN | Broadcom Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 031625 | /0070 | |
Apr 04 2011 | RAGHAVAN, BHARATH | Broadcom Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 031625 | /0070 | |
Apr 05 2011 | CAO, JUN | Broadcom Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 031625 | /0070 | |
Nov 14 2013 | Broadcom Corporation | (assignment on the face of the patent) | / | |||
Feb 01 2016 | Broadcom Corporation | BANK OF AMERICA, N A , AS COLLATERAL AGENT | PATENT SECURITY AGREEMENT | 037806 | /0001 | |
Jan 19 2017 | BANK OF AMERICA, N A , AS COLLATERAL AGENT | Broadcom Corporation | TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS | 041712 | /0001 | |
Jan 20 2017 | Broadcom Corporation | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 041706 | /0001 | |
May 09 2018 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | MERGER SEE DOCUMENT FOR DETAILS | 047229 | /0408 | |
Sep 05 2018 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT NUMBER 9,385,856 TO 9,385,756 PREVIOUSLY RECORDED AT REEL: 47349 FRAME: 001 ASSIGNOR S HEREBY CONFIRMS THE MERGER | 051144 | /0648 | |
Sep 05 2018 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE PREVIOUSLY RECORDED ON REEL 047229 FRAME 0408 ASSIGNOR S HEREBY CONFIRMS THE THE EFFECTIVE DATE IS 09 05 2018 | 047349 | /0001 |
Date | Maintenance Fee Events |
Jul 05 2019 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
Jun 28 2023 | M1552: Payment of Maintenance Fee, 8th Year, Large Entity. |
Date | Maintenance Schedule |
Jan 05 2019 | 4 years fee payment window open |
Jul 05 2019 | 6 months grace period start (w surcharge) |
Jan 05 2020 | patent expiry (for year 4) |
Jan 05 2022 | 2 years to revive unintentionally abandoned end. (for year 4) |
Jan 05 2023 | 8 years fee payment window open |
Jul 05 2023 | 6 months grace period start (w surcharge) |
Jan 05 2024 | patent expiry (for year 8) |
Jan 05 2026 | 2 years to revive unintentionally abandoned end. (for year 8) |
Jan 05 2027 | 12 years fee payment window open |
Jul 05 2027 | 6 months grace period start (w surcharge) |
Jan 05 2028 | patent expiry (for year 12) |
Jan 05 2030 | 2 years to revive unintentionally abandoned end. (for year 12) |