|
The ornamental design for a polarimeter and refractometer, as shown and described in solid lines.
|
The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.
Amamiya, Hideyuki, Tanaka, Masanosuke
Patent | Priority | Assignee | Title |
D801202, | Jul 09 2015 | Palintest Limited | Water quality testing meter |
Patent | Priority | Assignee | Title |
20030175157, | |||
D296086, | Mar 29 1985 | MARS, INCORPORATED, A CORP OF DELAWARE | Electronic circuit board tester |
D309867, | Sep 16 1987 | Beckman Instruments, Inc. | PH meter |
D371748, | Jul 06 1995 | DEUTSCHE BANK AG, NEW YORK BRANCH | Bench top liquid test meter |
D584975, | Jan 16 2008 | Qiagen Lake Constance GmbH | Analytical sample detection device |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jul 28 2014 | AMAMIYA, HIDEYUKI | ATAGO CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033556 | 0278 | |
Jul 28 2014 | TANAKA, MASANOSUKE | ATAGO CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033556 | 0278 | |
Aug 18 2014 | ATAGO CO., LTD. | (assignment on the face of the patent) |
Date | Maintenance Fee Events |
Date | Maintenance Schedule |