FIG. 1 is a front perspective view of a grip for a gem tester;
FIG. 2 is a left side elevation view of a grip for a gem tester;
FIG. 3 is right side elevation view of a grip for a gem tester;
FIG. 4 is a top plan view of a grip for a gem tester;
FIG. 5 is a bottom plan view of a grip for a gem tester;
FIG. 6 is a front elevation view of a grip for a gem tester; and,
FIG. 7 is a rear elevation view of a grip for a gem tester.
The dashed and dotted lines shown are provided for environmental purposes only and form no part of the claimed design.
Kessler, Daniel L., Kessler, Henry M.
| Patent |
Priority |
Assignee |
Title |
| Patent |
Priority |
Assignee |
Title |
| 10001466, |
Sep 28 2015 |
SY KESSLER SALES, INC |
Magnifying device for jewelry and system for use of same |
| 5159851, |
Sep 18 1991 |
|
Bicycle grip |
| 6724366, |
Apr 03 2001 |
PINEAPPLE34, LLC |
Thumb actuated x-y input device |
| 8564316, |
Jun 21 2010 |
SY KESSLER SALES, INC |
Gem tester |
| 8648466, |
Mar 19 2009 |
FERDINAND-BRAUN-INSTITUT GGMBH, LEIBNIZ-INSTITUT FÜR HÖCHSTFREQUENZTECHNIK |
Method for producing a metallization having two multiple alternating metallization layers for at least one contact pad and semiconductor wafer having said metallization for at least one contact pad |
| 8749253, |
Jun 21 2010 |
Sy Kessler Sales, Inc. |
Gem tester |
| 9134263, |
Jun 21 2010 |
Sy Kessler Sales, Inc. |
Gem tester |
| 9285357, |
Jun 21 2010 |
Sy Kessler Sales, Inc. |
Gem tester |
| 9341502, |
Sep 17 2012 |
Presidium Instruments Pte Ltd |
Analysis tool member |
| 9395350, |
Jun 21 2010 |
SY KESSLER SALES, INC |
Gem tester |
| D376548, |
Feb 22 1996 |
GREENLEE TEXTRON INC |
Hand held audio test probe |
| D511306, |
Sep 27 2004 |
HOPKINS MANUFACTURING CORPORATION |
Electronic voltage polarity indicator |
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Maintenance Fee Events |
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