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The ornamental design for a micrometer, substantially as shown and described. |
FIG. 1 is a perspective view of a micrometer showing my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left-side elevational view thereof;
FIG. 5 is a right-side elevational view thereof;
FIG. 6 is a top plan view thereof; and
FIG. 7 is a bottom plan view thereof.
Patent | Priority | Assignee | Title |
D273468, | Sep 03 1981 | Mitutoyo MGF. Co., Ltd. | Micrometer |
D273469, | Sep 03 1981 | Mitutoyo Mfg. Co., Ltd. | Micrometer |
D274891, | Sep 04 1981 | HOWMEDICA INC | Micrometer |
D729659, | Sep 02 2013 | Mitutoyo Corporation | Micrometer |
D740143, | Sep 02 2013 | Mitutoyo Corporation | Micrometer |
RE47140, | Dec 11 2013 | Tesa SA | Micrometer |
Patent | Priority | Assignee | Title |
3608201, | |||
3845564, | |||
4168575, | Oct 26 1976 | Kabushiki Kaisha Mitutoyo Seisakusho | Constant pressure measuring micrometer |
239704, | |||
D254655, | Sep 01 1977 | James Neill Holdings Limited | Micrometer |
D263809, | Oct 11 1979 | Mitutoyo Mfg. Co., Ltd. | Micrometer |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Mar 25 1981 | TANADA TETSUNORI | MITUTOYO MFG CO LTD | ASSIGNMENT OF ASSIGNORS INTEREST | 003876 | /0522 | |
Apr 02 1981 | Mitutoyo Mfg. Co., Ltd. | (assignment on the face of the patent) | / |
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