Patent
   RE47140
Priority
Dec 11 2013
Filed
Mar 11 2016
Issued
Nov 27 2018
Expiry
Jun 03 2034
Assg.orig
Entity
unknown
1
29
EXPIRED
0. The ornamental design for a micrometer, as shown and described.

FIG. 1 is an upper perspective view of an exemplary micrometer;

FIG. 2 is a front view of the micrometer;

FIG. 3 is a rear view of the micrometer;

FIG. 4 is a bottom view of the micrometer;

FIG. 5 is a top view of the micrometer;

FIG. 6 is a left side view of the micrometer;

FIG. 7 is a front view of another exemplary micrometer, with the other views the same as shown above in connection with FIG. 1; and,

FIG. 8 is a front view of still another exemplary micrometer, with the other view the same as shown above in connection with FIG. 1.

FIG. 9 is a top and front perspective view of a micrometer;

FIG. 10 is a front elevation view of the micrometer;

FIG. 11 is a rear elevation view of the micrometer;

FIG. 12 is a left side elevation view of the micrometer;

FIG. 13 is a top plan view of the micrometer; and,

FIG. 14 is a bottom plan view of the micrometer.

Biselx, Frédéric, Karawa, Stéphane

Patent Priority Assignee Title
ER5599,
Patent Priority Assignee Title
4255861, Jul 02 1979 KABUSHIKI KAISHA MITUTOYO SEISAKUSHO, A CORP OF JAPAN Electrically digital display micrometer
4578868, Apr 01 1983 Mitutoyo Mfg. Co., Ltd. Digital display measuring apparatus
5433016, Dec 24 1992 Mitutoyo Corporation Linear displacement measuring apparatus
5495677, Oct 01 1993 STRIDE TOOL, INC Digital display micrometer gauge
5691646, Dec 07 1994 Mitutoya Corporation Capacitance-type displacement measuring device with electrodes having spiral patterns
5920198, Sep 20 1996 Mitutoyo Corporation Capacitance-type displacement measuring device
6247244, Jul 16 1998 TESA S A Device for longitudinal measurement
6308433, Nov 11 1998 Mitutoyo Corporation Micrometer that holds displayed displacement when retraction amount is less than a set amount
20110247231,
20130091720,
20130276319,
20150059196,
D254655, Sep 01 1977 James Neill Holdings Limited Micrometer
D256339, Mar 22 1978 Mitutoyo Manufacturing Company, Ltd. Micrometer
D263809, Oct 11 1979 Mitutoyo Mfg. Co., Ltd. Micrometer
D268740, Oct 29 1980 Mitutoyo Mfg. Co., Ltd. Micrometer
D273468, Sep 03 1981 Mitutoyo MGF. Co., Ltd. Micrometer
D273469, Sep 03 1981 Mitutoyo Mfg. Co., Ltd. Micrometer
D273664, Aug 27 1981 VAN LAACK SCHMITZ & ELTSCHIG GMBH & CO , A CORP OF WEST GERMANY Micrometer
D274413, Aug 26 1981 Mitutoyo Mfg. Co., Ltd. Micrometer
D274891, Sep 04 1981 HOWMEDICA INC Micrometer
D274990, Oct 15 1981 Mitutoyo Mfg. Co., Ltd. Micrometer
D286141, Jan 10 1984 Mitutoyo Mfg. Co., Ltd. Micrometer
D391180, Aug 27 1996 Thread micrometer
D412675, Aug 24 1998 Flexbar Machine Corporation Digital drum/rotor micrometer
D429172, Jun 26 1998 Tesa SA Micrometer
D611371, Feb 04 2009 Mitutoyo Corporation Micrometer
D614054, May 28 2009 Mitutoyo Corporation Micrometer head
D729659, Sep 02 2013 Mitutoyo Corporation Micrometer
///
Executed onAssignorAssigneeConveyanceFrameReelDoc
Mar 03 2014BISELX, FRÉDÉRICTesa SAASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0465320834 pdf
Mar 03 2014KARAWA, STÉPHANETesa SAASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0465320834 pdf
Mar 11 2016Tesa SA(assignment on the face of the patent)
Date Maintenance Fee Events


Date Maintenance Schedule
Nov 27 20214 years fee payment window open
May 27 20226 months grace period start (w surcharge)
Nov 27 2022patent expiry (for year 4)
Nov 27 20242 years to revive unintentionally abandoned end. (for year 4)
Nov 27 20258 years fee payment window open
May 27 20266 months grace period start (w surcharge)
Nov 27 2026patent expiry (for year 8)
Nov 27 20282 years to revive unintentionally abandoned end. (for year 8)
Nov 27 202912 years fee payment window open
May 27 20306 months grace period start (w surcharge)
Nov 27 2030patent expiry (for year 12)
Nov 27 20322 years to revive unintentionally abandoned end. (for year 12)