Patent
   D273465
Priority
Oct 23 1981
Filed
Oct 23 1981
Issued
Apr 17 1984
Expiry
Apr 17 1998
Assg.orig
Entity
unknown
1
5
n/a
The ornamental design for a positest thickness gage, as shown and described.

FIG. 1 is a front elevational view of a thickness tester showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a left side elevational view thereof.

Koch, Frank

Patent Priority Assignee Title
D278211, Sep 13 1982 Coating thickness gage
Patent Priority Assignee Title
3423837,
186549,
D254778, Jul 07 1977 Tokyo Keiki Company Limited Ultrasonic wave thickness meter
D256338, Sep 28 1978 FIRST SOURCE FINANCIAL LLP Range finder
D264444, Sep 28 1979 Gretag Aktiengesellschaft Densitymeter
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Oct 23 1981DeFelsko Corporation(assignment on the face of the patent)
Dec 02 1981KOCH, FRANKDEFELSKO CORPORATION, A CORP OF NYASSIGNMENT OF ASSIGNORS INTEREST 0039500170 pdf
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