Patent
   D275659
Priority
Jan 15 1982
Filed
Jan 15 1982
Issued
Sep 25 1984
Expiry
Sep 25 1998
Assg.orig
Entity
unknown
7
8
n/a
The ornamental design for an electronic testing device for a microprocessor, as shown and described.

FIG. 1 is a top and right front perspective view of an electronic testing device for a microprocessor showing my new design;

FIG. 2 is a right side elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a bottom plan view thereof.

Hackamack, Paul

Patent Priority Assignee Title
D281401, Jun 20 1983 The Superior Electric Company Detector module for a line monitor or the like
D296529, Aug 12 1985 Motorola Inc. Radio testing device or similar article
D311497, Dec 08 1986 Cable configuration analyzer and tester
D334175, Apr 12 1991 K & S INTERCONNECT, INC Probe interface test board
D655697, Jan 20 2010 TELIT CINTERION DEUTSCHLAND GMBH Radio frequency module
D660828, Nov 09 2010 GEMALTO M2M GMBH Wireless module
D870575, Aug 02 2018 BANKSUPPLIES, INC Multi-counterfeit detection station
Patent Priority Assignee Title
3454921,
3501698,
3912983,
4115735, Oct 14 1976 SCHLUMBERGER SYSTEMS AND SERVICES, INC Test fixture employing plural platens for advancing some or all of the probes of the test fixture
239935,
D267554, Jun 18 1980 SCHLUMBERGER ELECTRONICS U K LTD Multi-function digital-circuit tester or similar article
D269673, Mar 28 1979 Svea Data Communication & Computer Aktiebolag Variable cable connector interface for data processing equipment
D271297, Mar 30 1981 NSI ENTERPRISES INC Combined circuit connector and switching module
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jan 12 1982HACKAMACK, PAULUgly ProductsASSIGNMENT OF ASSIGNORS INTEREST 0039650550 pdf
Jan 15 1982Ugly Products(assignment on the face of the patent)
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