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Patent
D334175
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Priority
Apr 12 1991
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Filed
Apr 12 1991
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Issued
Mar 23 1993
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Expiry
Mar 23 2007
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Assg.orig
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Entity
unknown
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6
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10
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n/a
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The ornamental design for a probe interface test board, as shown and described.
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FIG. 1 is a top plan view of a probe interface test board showing our new
design;
FIG. 2 is a bottom plan view thereof; and,
FIG. 3 is a front side elevational view thereof, the left, right, and rear
elevational views being a mirror image.
Barabi, Nasser, Barabi, Iraj
Patent |
Priority |
Assignee |
Title |
D465772, |
Apr 20 2001 |
Hewlett Packard Enterprise Development LP |
Printed circuit board |
D821337, |
Jan 20 2015 |
MODUS TEST, LLC |
Contact field for a printed circuit board |
D821338, |
Jan 20 2015 |
MODUS TEST, LLC |
Contact fields for a printed circuit board |
D851516, |
Feb 05 2018 |
Virginia Panel Corporation |
Interface test adapter |
D927429, |
Mar 15 2019 |
MODUS TEST, LLC |
Plurality of contact fields for a printed circuit board |
D933016, |
Mar 15 2019 |
MODUS TEST, LLC |
Contact field for a printed circuit board |
Patent |
Priority |
Assignee |
Title |
3496514, |
|
|
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3813644, |
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|
4540229, |
Apr 12 1982 |
AT&T Bell Laboratories |
Electrical interconnection apparatus |
4582383, |
Jul 30 1981 |
Mitsubishi Denki Kabushiki Kaisha |
Terminal apparatus and a batch inserting type test plug for a drawer type relay |
4655535, |
Jun 03 1985 |
Switchcraft, Inc. |
Jack module and jackfield |
5008614, |
Oct 11 1988 |
AVAGO TECHNOLOGIES ECBU IP SINGAPORE PTE LTD |
TAB frame and process of testing same |
D255351, |
Jun 28 1978 |
Midgard Electronic Company, Inc. |
Circuit board |
D261760, |
Dec 22 1978 |
Pitney Bowes Inc. |
Electronic postal rate memory |
D275659, |
Jan 15 1982 |
Ugly Products |
Electronic testing device for a microprocessor |
D319629, |
Apr 13 1988 |
IBIDEN CO , LTD , A JAPANESE CORP |
Semiconductor substrate with conducting pattern |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a