Patent
   D346338
Priority
Feb 26 1993
Filed
Feb 26 1993
Issued
Apr 26 1994
Expiry
Apr 26 2008
Assg.orig
Entity
unknown
4
3
n/a
The ornamental design for an electrical test probe, as shown and described.

FIG. 1 is a left side elevation view of the electrical test probe showing our new design;

FIG. 2 is a right side elevation view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a rear elevation view thereof; and,

FIG. 6 is a front elevation view thereof.

Portions of the cord member have been eliminated for ease of illustration.

Nightingale, Mark W., Myers, Jonathan E.

Patent Priority Assignee Title
D355861, Sep 15 1992 Electronic voltage tester instrument
D391503, Dec 23 1996 Expandable wire current tester
D538936, Jul 29 2003 KALTENBACH VOIGT GMBH & CO KG Probe
D669083, Nov 16 2010 DATAMARS SA Wireless tag reader
Patent Priority Assignee Title
4978921, May 01 1989 General Electric Company Electrode probe for use in aqueous environments of high temperature and high radiation
5032787, Nov 03 1989 EVERETT CHARLES TECHNOLOGIES, INC Electrical test probe having rotational control of the probe shaft
5041781, Dec 28 1989 Stack Electronics Co., Ltd. Assembly to be fitted in a cylinder of a probe
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Feb 23 1993NIGHTINGALE, MARK W Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0068450744 pdf
Feb 23 1993MYERS, JONATHAN E Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0068450744 pdf
Feb 26 1993Tektronix, Inc.(assignment on the face of the patent)
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