|
The ornamental design for an expandable wire current tester, as shown. |
FIG. 1 is a front plan view of the expandable wire current tester of the present invention;
FIG. 2 is a rear plan view of the expandable wire current tester of FIG. 1;
FIG. 3 is a left side plan view of the expandable wire current tester of FIG. 1;
FIG. 4 is a right side plan view of the expandable wire current tester of FIG. 1;
FIG. 5 is a top plan view of the expandable wire current tester of FIG. 1; and,
FIG. 6 is a bottom plan view of the expandable wire current tester of FIG. 1.
Patent | Priority | Assignee | Title |
D409929, | Nov 06 1997 | Fluke Corporation | Electrical test probe |
Patent | Priority | Assignee | Title |
5424630, | Sep 30 1993 | Circuit test device for detecting the presence of an electric current in a conductor | |
D346122, | Mar 01 1993 | Tektronix, Inc. | Probing head for an electrical test probe |
D346338, | Feb 26 1993 | Tektronix, Inc. | Electrical test probe |
D349658, | Sep 15 1992 | Electronic voltage tester | |
D355861, | Sep 15 1992 | Electronic voltage tester instrument |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Date | Maintenance Fee Events |
Date | Maintenance Schedule |