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The ornamental design for an electrical test probe, as shown. |
FIG. 1 is a top, front, and right side perspective view of an electrical test probe showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a back elevational view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 a bottom plan view thereof.
The broken line showing is for illustrative purposes only and forms no part of the claimed design.
Fisher, Steven W., Aikins, Brian S., Chamberlain, Craig P.
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Oct 24 1997 | FISHER, STEVEN W | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008787 | /0213 | |
Oct 29 1997 | AIKINS, BRIAN S | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008787 | /0213 | |
Nov 05 1997 | CHAMBERLAIN, CRAIG P | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008787 | /0213 | |
Nov 06 1997 | Fluke Corporation | (assignment on the face of the patent) | / |
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