Patent
   D427091
Priority
Oct 29 1999
Filed
Oct 29 1999
Issued
Jun 27 2000
Expiry
Jun 27 2014
Assg.orig
Entity
unknown
2
5
n/a
The ornamental design for an electrical probe, as shown and described.

FIG. 1 is a perspective view of a an embodiment of an electrical probe showing my new design;

FIG. 2 is a left side elevation view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a rear elevation view thereof;

FIG. 6 is a right side elevation view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken line showing is for illustrative purposes only and forms no part of the claimed design.

Suurmeijer, Christian Peter

Patent Priority Assignee Title
D444401, Jul 31 2000 TELEDYNE LECROY, INC Electrical test probe wedge tip
D950736, Feb 18 2020 SMTP MEDICAL CO., LTD. Shaft for ultrasonic surgical instruments
Patent Priority Assignee Title
5898299, Jun 21 1996 S&G Tool Aid Corp. Probe type tester with circuit board stabilizer
D344681, Jun 13 1990 Tektronix, Inc. Head assembly for a switchable electrical test probe
D346122, Mar 01 1993 Tektronix, Inc. Probing head for an electrical test probe
D409929, Nov 06 1997 Fluke Corporation Electrical test probe
D409930, Dec 01 1998 Fluke Corporation Electrical probe
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Oct 25 1999SUURMEIJER, CHRISTIAN P Fluke CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0103680727 pdf
Oct 25 1999B V PEMSTARFluke CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0103680727 pdf
Oct 29 1999Fluke Corporation(assignment on the face of the patent)
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