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The ornamental design for a probing head for an electrical test probe, as shown and described. |
FIG. 1 is a left side elevation view of the probing head for an electrical test probe showing our new design;
FIG. 2 is a right side elevation view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a front elevation view thereof; and,
FIG. 6 is a rear elevation view thereof.
The cord member has been broken away indicating an indeterminate length.
Nightingale, Mark W., Myers, Jonathan E.
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Feb 23 1993 | NIGHTINGALE, MARK W | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 006845 | /0750 | |
Feb 23 1993 | MYERS, JONATHAN E | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 006845 | /0750 | |
Mar 01 1993 | Tektronix, Inc. | (assignment on the face of the patent) | / |
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