Patent
   D346122
Priority
Mar 01 1993
Filed
Mar 01 1993
Issued
Apr 19 1994
Expiry
Apr 19 2008
Assg.orig
Entity
unknown
4
3
n/a
The ornamental design for a probing head for an electrical test probe, as shown and described.

FIG. 1 is a left side elevation view of the probing head for an electrical test probe showing our new design;

FIG. 2 is a right side elevation view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevation view thereof; and,

FIG. 6 is a rear elevation view thereof.

The cord member has been broken away indicating an indeterminate length.

Nightingale, Mark W., Myers, Jonathan E.

Patent Priority Assignee Title
D391503, Dec 23 1996 Expandable wire current tester
D427091, Oct 29 1999 Fluke Corporation Electrical probe
D427535, Oct 29 1999 Fluke Corporation Electrical probe
D427922, Oct 29 1999 Fluke Corporation Electrical probe
Patent Priority Assignee Title
4978921, May 01 1989 General Electric Company Electrode probe for use in aqueous environments of high temperature and high radiation
5032787, Nov 03 1989 EVERETT CHARLES TECHNOLOGIES, INC Electrical test probe having rotational control of the probe shaft
5041781, Dec 28 1989 Stack Electronics Co., Ltd. Assembly to be fitted in a cylinder of a probe
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Feb 23 1993NIGHTINGALE, MARK W Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0068450750 pdf
Feb 23 1993MYERS, JONATHAN E Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0068450750 pdf
Mar 01 1993Tektronix, Inc.(assignment on the face of the patent)
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