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The ornamental design for an electrical probe, as shown and described. |
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FIG. 1 is a perspective view of an embodiment of an electrical probe showing my new design;
FIG. 2 is a left side elevation view thereof;
FIG. 3 is a front elevation view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a rear elevation view thereof;
FIG. 6 is a right side elevation view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken line showing is for illustrative purposes only and forms no part of the claimed design.
| Patent | Priority | Assignee | Title |
| Patent | Priority | Assignee | Title |
| 5898299, | Jun 21 1996 | S&G Tool Aid Corp. | Probe type tester with circuit board stabilizer |
| D344681, | Jun 13 1990 | Tektronix, Inc. | Head assembly for a switchable electrical test probe |
| D346122, | Mar 01 1993 | Tektronix, Inc. | Probing head for an electrical test probe |
| D409929, | Nov 06 1997 | Fluke Corporation | Electrical test probe |
| D409930, | Dec 01 1998 | Fluke Corporation | Electrical probe |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Oct 25 1999 | SUURMEIJER, CHRISTIAN P | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010356 | /0610 | |
| Oct 25 1999 | B V , PEMSTAR | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010356 | /0610 | |
| Oct 29 1999 | Fluke Corporation | (assignment on the face of the patent) | / |
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