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The ornamental design for an electrical probe, as shown and described. |
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FIG. 1 is a perspective view of a an embodiment of an electrical probe showing my new design;
FIG. 2 is a left side elevation view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a right side elevation view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a front elevation view thereof; and,
FIG. 7 is a rear elevation view thereof.
| Patent | Priority | Assignee | Title |
| D427091, | Oct 29 1999 | Fluke Corporation | Electrical probe |
| D427535, | Oct 29 1999 | Fluke Corporation | Electrical probe |
| D427922, | Oct 29 1999 | Fluke Corporation | Electrical probe |
| D581822, | Jan 05 2007 | Innova Electronics Corporation | Test light |
| Patent | Priority | Assignee | Title |
| D349658, | Sep 15 1992 | Electronic voltage tester |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Nov 02 1998 | SUURMEIJER, CHRISTIAN | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 009620 | /0677 | |
| Dec 01 1998 | Fluke Corporation | (assignment on the face of the patent) | / |
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