Console for measurement scanner for semi-conductor

Abstract

Description

FIG. 1 is a front, top and right side perspective view of a console for measurement scanner for semi-conductor showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for a console for measurement scanner for semi-conductor, as shown.