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The ornamental design for a clamp-on current probe, as shown. |
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FIG. 1 is a front elevational view of the clamp-on current probe according to our new design;
FIG. 2 is a bottom plan view of the clamp-on current probe of FIG. 1;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a left side elevational view thereof, as seen from the left side of FIG. 1; and,
FIG. 6 is a right side elevational view thereof.
| Patent | Priority | Assignee | Title |
| D401172, | Nov 19 1997 | Kyoritsu Electrical Instruments Works, Ltd. | Ammeter |
| D401874, | Oct 16 1996 | Societe Chauvin Arnoux | Clamp-on current probe |
| D413538, | Aug 04 1998 | Clamp meter |
| Patent | Priority | Assignee | Title |
| 5495169, | Oct 12 1984 | Clamp-on current sensor | |
| D359006, | Apr 05 1994 | DESA INTERNATIONAL LLC | Digital clamp meter |
| D374405, | Mar 13 1995 | Clamp meter |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Mar 05 1996 | Societe Chauvin Arnoux | (assignment on the face of the patent) | / | |||
| May 04 1996 | ARNOUX, DANIEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 007944 | /0450 | |
| May 04 1996 | ARNOUX, AXEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 007944 | /0450 |
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