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The ornamental design for a clamp-on current probe, as shown. |
FIG. 1 is a perspective view of the clamp-on current probe according to our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof, as seen from the left side of FIG. 2; and,
FIG. 7 is a right side elevational view thereof.
Patent | Priority | Assignee | Title |
Patent | Priority | Assignee | Title |
4518913, | May 22 1981 | H.E.M.E. International Limited | Measuring probes |
D383989, | Mar 05 1996 | Societe Chauvin Arnoux | Clamp-on current probe |
D388346, | Mar 05 1996 | Societe Chauvin Arnoux | Clamp-on current probe |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Oct 16 1996 | Societe Chauvin Arnoux | (assignment on the face of the patent) | / | |||
Oct 16 1996 | ARNOUX, DANIEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008305 | /0783 | |
Oct 16 1996 | ARNOUX, AXEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008305 | /0783 |
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