Contactor for semiconductor IC testers

Abstract

Description

FIG. 1 is a perspective view of a contactor for semiconductor IC testers showing my new design;

FIG. 2 is a top plan view in a reduced scale of FIG. 1;

FIG. 3 is a bottom plan in a reduced scale of FIG. 1;

FIG. 4 is a front elevational view in a reduced scale of FIG. 1, the rear elevational view being a mirror image of the front elevational view;

FIG. 5 is a left side elevational view in a reduced scale of FIG. 1, the right side elevational view beign a mirror image of the left side elevational view; and,

FIG. 6 is an enlarged center horizontal cross-sectional view of FIG. 2.

Claims

The ornamental design for a contactor for semiconductor ic testers, as shown and described.