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The ornamental design of a measurement surveying device, as shown and described. |
FIG. 1 is a perspective view of the mesurement surveying device;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
Wakabayashi, Akira, Ueno, Masayuki, Kaneko, Kenji
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Jun 04 1999 | KANEKO, KENJI | Asahi Seimitsu Kabushiki Kaisha | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010037 | /0794 | |
Jun 04 1999 | UENO, MASAYUKI | Asahi Seimitsu Kabushiki Kaisha | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010037 | /0794 | |
Jun 04 1999 | WAKABAYASHI, AKIRA | Asahi Seimitsu Kabushiki Kaisha | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010037 | /0794 | |
Jun 21 1999 | Asahi Seimitsu Kabushiki Kaisha | (assignment on the face of the patent) | / | |||
Mar 10 2005 | PENTAX PRECISION CO , LTD FORMERLY KNOWN AS ASAHI SEIMITSU KABUSHIKI KAISHA | PENTAX Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 016153 | /0069 |
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