Patent
   D447066
Priority
May 10 2000
Filed
Oct 19 2000
Issued
Aug 28 2001
Expiry
Aug 28 2015
Assg.orig
Entity
unknown
12
12
n/a
The ornamental design for a measurement surveying device, as shown and described.

FIG. 1 is a front elevational view of the measurement surveying device;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a partially-enlarged view of the rear elevational view;

FIG. 8 is a partially-enlarged view of the right side elevational view;

FIG. 9 is a partially-enlarged view of the left side elevational view;

FIG. 10 is a partially-enlarged view of the top plan view;

FIG. 11 is a perspective view of the measurement surveying device; and,

FIG. 12 is another perspective view of the measurement surveying device.

Ueno, Masayuki, Kaneko, Kenji, Takayama, Homu

Patent Priority Assignee Title
D526588, Sep 10 2004 Trimble AB Surveying device
D531921, Feb 17 2005 TOPCON CORPORATION Portion of electronic theodolite
D532325, Feb 09 2005 Sokkia Co., Ltd. Portion of electronic theodolite
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D795720, Jan 18 2016 TOPCON CORPORATION Surveying instrument
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 11 2000TAKAYAMA, HOMUAsahi Seimitsu Kabushiki KaishaASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0112200318 pdf
Sep 11 2000KANEKO, KENJIAsahi Seimitsu Kabushiki KaishaASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0112200318 pdf
Sep 11 2000UENO, MASAYUKIAsahi Seimitsu Kabushiki KaishaASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0112200318 pdf
Oct 19 2000Asahi Seimitsu Kabushiki Kaisha(assignment on the face of the patent)
Mar 10 2005PENTAX PRECISION CO , LTD FORMERLY KNOWN AS ASAHI SEIMITSU KABUSHIKI KAISHA PENTAX CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0161530069 pdf
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