Patent
   D795721
Priority
Jan 27 2016
Filed
Mar 14 2016
Issued
Aug 29 2017
Expiry
Aug 29 2032
Assg.orig
Entity
unknown
7
5
n/a
The ornamental design for a surveying instrument, as shown and described.

FIG. 1 is a front view of the surveying instrument showing my new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a perspective view thereof;

FIG. 8 is an enlarged view of a screen display of the surveying instrument in FIG. 1; and,

FIG. 9 is an enlarged view of the screen display, taken along lines 9-9 in FIG. 7.

The broken line showing is for the purpose of illustrating environmental structure and forms no part of the claimed the design.

Ishii, Mitsuo

Patent Priority Assignee Title
D834968, Dec 21 2016 TOPCON CORPORATION Light wave distance measuring theodolite
D834969, Dec 21 2016 TOPCON CORPORATION Light wave distance measuring theodolite
D834970, Mar 03 2017 Surveying instrument
D835532, Mar 03 2017 Surveying instrument
D859185, Jan 22 2018 Surveying instrument
ER4882,
ER7095,
Patent Priority Assignee Title
9599476, Dec 30 2010 TOMTOM GLOBAL CONTENT B V Seamless network generation
D431199, Jan 05 1999 Lutron Technology Company LLC Display panel
D447066, May 10 2000 PENTAX Corporation Measurement surveying device
D471476, Apr 18 2002 BCOM Electronics Inc. Computer panel for an automobile
D781730, Jun 16 2015 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
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Mar 08 2016ISHII, MITSUOTOPCON CORPORATIONASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0379690628 pdf
Mar 14 2016TOPCON CORPORATION(assignment on the face of the patent)
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