Patent
   D781730
Priority
Jun 16 2015
Filed
Nov 02 2015
Issued
Mar 21 2017
Expiry
Mar 21 2032
Assg.orig
Entity
unknown
18
4
n/a
The ornamental design for an optical measuring theodolite using light wave, as shown and described.

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side perspective view thereof; and,

FIG. 8 is a rear, left-side perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Ishii, Mitsuo, Nakamura, Satoshi

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Patent Priority Assignee Title
8897482, Feb 12 2008 Trimble AB Stereo photogrammetry from a single station using a surveying instrument with an eccentric camera
D684068, Sep 22 2011 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
D684069, Sep 22 2011 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
D723953, Oct 07 2013 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Oct 30 2015ISHII, MITSUOKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0369370377 pdf
Oct 30 2015NAKAMURA, SATOSHIKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0369370377 pdf
Nov 02 2015Kabushiki Kaisha Topcon(assignment on the face of the patent)
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