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Patent
D781730
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Priority
Jun 16 2015
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Filed
Nov 02 2015
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Issued
Mar 21 2017
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Expiry
Mar 21 2032
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Assg.orig
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Entity
unknown
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18
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4
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n/a
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The ornamental design for an optical measuring theodolite using light wave, as shown and described.
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FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a left-side elevational view thereof;
FIG. 4 is a right-side elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a front, right-side perspective view thereof; and,
FIG. 8 is a rear, left-side perspective view thereof.
The broken lines depict environmental subject matter only and form no part of the claimed design.
Ishii, Mitsuo, Nakamura, Satoshi
Patent |
Priority |
Assignee |
Title |
10324073, |
Jan 16 2015 |
Industrial Scientific Corporation |
Modular gas monitoring system |
11408876, |
Jan 16 2015 |
Industrial Scientific Corporation |
Modular gas monitoring system |
D795720, |
Jan 18 2016 |
TOPCON CORPORATION |
Surveying instrument |
D795721, |
Jan 27 2016 |
TOPCON CORPORATION |
Surveying instrument |
D834968, |
Dec 21 2016 |
TOPCON CORPORATION |
Light wave distance measuring theodolite |
D834969, |
Dec 21 2016 |
TOPCON CORPORATION |
Light wave distance measuring theodolite |
D843860, |
Nov 09 2016 |
Leica Geosystems AG |
Surveying instrument |
D844468, |
Nov 09 2016 |
Leica Geosystems AG |
Case for surveying instrument |
D845794, |
Nov 09 2016 |
Leica Geosystems AG |
Surveying instrument |
D859185, |
Jan 22 2018 |
|
Surveying instrument |
D873158, |
Nov 09 2016 |
Leica Geosystems AG |
Surveying instrument |
D901315, |
Dec 25 2018 |
|
Surveying instrument |
D962797, |
Jan 17 2020 |
TOPCON CORPORATION |
Surveying instrument |
D980734, |
Jan 15 2016 |
Industrial Scientific Corporation |
Gas monitoring device |
ER4882, |
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|
ER7095, |
|
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|
ER7607, |
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|
ER9240, |
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Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a