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Patent
D845794
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Priority
Nov 09 2016
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Filed
Mar 13 2017
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Issued
Apr 16 2019
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Expiry
Apr 16 2034
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Assg.orig
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Entity
unknown
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3
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18
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n/a
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The ornamental design for a surveying instrument, as shown.
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This application is related to a U.S. design application Ser. No. 29/596,908 entitled “Surveying Instrument” that claims the same priority.
This application is related to a U.S. design application Ser. No. 29/596,928 entitled “Case for Surveying Instrument” that claims the same priority.
FIG. 1 is a front perspective view of a surveying instrument.
FIG. 2 is a front elevation view of the surveying instrument.
FIG. 3 is a left elevation view of the surveying instrument.
FIG. 4 is a rear elevation view of the surveying instrument.
FIG. 5 is a right elevation view of the surveying instrument.
FIG. 6 is a top view of the surveying instrument; and,
FIG. 7 is a bottom view of the surveying instrument.
The broken lines depict portions of the surveying instrument that form no part of the claimed design.
Wieser, Matthias
Patent |
Priority |
Assignee |
Title |
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CN3532119, |
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D581819, |
Jun 19 2007 |
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Kabushiki Kaisha Topcon |
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D781730, |
Jun 16 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D781731, |
Jun 10 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D787345, |
Apr 24 2015 |
Kabushiki Kaisha Topcon |
Light wave optical measuring theodolite |
RE44112, |
Sep 18 2009 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
RE44751, |
Sep 18 2009 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a