Patent
   D845794
Priority
Nov 09 2016
Filed
Mar 13 2017
Issued
Apr 16 2019
Expiry
Apr 16 2034
Assg.orig
Entity
unknown
3
18
n/a
The ornamental design for a surveying instrument, as shown.

This application is related to a U.S. design application Ser. No. 29/596,908 entitled “Surveying Instrument” that claims the same priority.

This application is related to a U.S. design application Ser. No. 29/596,928 entitled “Case for Surveying Instrument” that claims the same priority.

FIG. 1 is a front perspective view of a surveying instrument.

FIG. 2 is a front elevation view of the surveying instrument.

FIG. 3 is a left elevation view of the surveying instrument.

FIG. 4 is a rear elevation view of the surveying instrument.

FIG. 5 is a right elevation view of the surveying instrument.

FIG. 6 is a top view of the surveying instrument; and,

FIG. 7 is a bottom view of the surveying instrument.

The broken lines depict portions of the surveying instrument that form no part of the claimed design.

Wieser, Matthias

Patent Priority Assignee Title
D873158, Nov 09 2016 Leica Geosystems AG Surveying instrument
D906141, Jun 26 2019 Surveying instrument
D906846, Jun 07 2019 Surveying instrument
Patent Priority Assignee Title
20070155069,
CN3532119,
CN3541256,
D581819, Jun 19 2007 TOPCON CORPORATION Automatic leveling laser marking instrument
D638318, Mar 18 2010 RIEGL LASER MEASUREMENT SYSTEMS GMBH Laser scanner
D642485, Mar 18 2010 RIEGL LASER MEASUREMENT SYSTEMS GMBH Laser scanner
D705678, Feb 21 2012 Faro Technologies, Inc. Laser tracker
D723398, Aug 06 2013 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
D766753, Mar 20 2015 Kabushiki Kaisha Topcon Optical measuring thedolite using light wave
D766754, Apr 03 2015 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
D768516, Apr 03 2015 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
D777588, Jun 23 2015 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
D778745, Apr 24 2015 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
D781730, Jun 16 2015 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
D781731, Jun 10 2015 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
D787345, Apr 24 2015 Kabushiki Kaisha Topcon Light wave optical measuring theodolite
RE44112, Sep 18 2009 RIEGL LASER MEASUREMENT SYSTEMS GMBH Laser scanner
RE44751, Sep 18 2009 RIEGL LASER MEASUREMENT SYSTEMS GMBH Laser scanner
//
Executed onAssignorAssigneeConveyanceFrameReelDoc
Mar 13 2017Leica Geosystems AG(assignment on the face of the patent)
Mar 20 2017WIESER, MATTHIASLeica Geosystems AGASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0422380732 pdf
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule