PTO
Wrapper
PDF
|
Dossier
Espace
Google
|
|
Patent
D873158
|
Priority
Nov 09 2016
|
Filed
Jun 21 2018
|
Issued
Jan 21 2020
|
Expiry
Jan 21 2035
|
|
Assg.orig
|
|
Entity
unknown
|
3
|
20
|
n/a
|
|
|
The ornamental design for a surveying instrument, as shown.
|
FIG. 1 is a left-front perspective view of a surveying instrument.
FIG. 2 is a right-rear perspective view thereof.
FIG. 3 is a front elevation view thereof.
FIG. 4 is a left elevation view thereof.
FIG. 5 is a rear elevation view thereof.
FIG. 6 is a right elevation view thereof.
FIG. 7 is a top view thereof; and,
FIG. 8 is a bottom view thereof.
The broken lines depict portions of the surveying instrument that form no part of the claimed design.
Wieser, Matthias
Patent |
Priority |
Assignee |
Title |
20070155069, |
|
|
|
20140078519, |
|
|
|
D581819, |
Jun 19 2007 |
TOPCON CORPORATION |
Automatic leveling laser marking instrument |
D638318, |
Mar 18 2010 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
D642485, |
Mar 18 2010 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
D705678, |
Feb 21 2012 |
Faro Technologies, Inc. |
Laser tracker |
D723398, |
Aug 06 2013 |
Kabushiki Kaisha Topcon |
Light wave distance measuring theodolite |
D766753, |
Mar 20 2015 |
Kabushiki Kaisha Topcon |
Optical measuring thedolite using light wave |
D766754, |
Apr 03 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D768516, |
Apr 03 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D777588, |
Jun 23 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D778745, |
Apr 24 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D781730, |
Jun 16 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D781731, |
Jun 10 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
D787345, |
Apr 24 2015 |
Kabushiki Kaisha Topcon |
Light wave optical measuring theodolite |
D843860, |
Nov 09 2016 |
Leica Geosystems AG |
Surveying instrument |
D844468, |
Nov 09 2016 |
Leica Geosystems AG |
Case for surveying instrument |
D845794, |
Nov 09 2016 |
Leica Geosystems AG |
Surveying instrument |
RE44112, |
Sep 18 2009 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
RE44751, |
Sep 18 2009 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jun 21 2018 | | Leica Geosystems AG | (assignment on the face of the patent) | | / |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a