This application is related to a U.S. design application Ser. No. 29/596,907 entitled “Surveying Instrument” that claims the same priority.
This application is related to a U.S. design application Ser. No. 29/596,928 entitled “Case for Surveying Instrument” that claims the same priority.
FIG. 1 is a right-front perspective view of a surveying instrument.
FIG. 2 is a right-rear perspective view of the surveying instrument.
FIG. 3 is a front elevation view of the surveying instrument.
FIG. 4 is a left elevation view of the surveying instrument.
FIG. 5 is a rear elevation view of the surveying instrument.
FIG. 6 is a right elevation view of the surveying instrument.
FIG. 7 is a top view of the surveying instrument; and,
FIG. 8 is a bottom view of the surveying instrument.
The broken lines depict portions of the surveying instrument that form no part of the claimed design.
| Patent |
Priority |
Assignee |
Title |
| 20070155069, |
|
|
|
| CN3532119, |
|
|
|
| CN3541256, |
|
|
|
| D581819, |
Jun 19 2007 |
TOPCON CORPORATION |
Automatic leveling laser marking instrument |
| D638318, |
Mar 18 2010 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
| D642485, |
Mar 18 2010 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
| D705678, |
Feb 21 2012 |
Faro Technologies, Inc. |
Laser tracker |
| D723398, |
Aug 06 2013 |
Kabushiki Kaisha Topcon |
Light wave distance measuring theodolite |
| D766753, |
Mar 20 2015 |
Kabushiki Kaisha Topcon |
Optical measuring thedolite using light wave |
| D766754, |
Apr 03 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
| D768516, |
Apr 03 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
| D777588, |
Jun 23 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
| D778745, |
Apr 24 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
| D781730, |
Jun 16 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
| D781731, |
Jun 10 2015 |
Kabushiki Kaisha Topcon |
Optical measuring theodolite using light wave |
| D787345, |
Apr 24 2015 |
Kabushiki Kaisha Topcon |
Light wave optical measuring theodolite |
| RE44112, |
Sep 18 2009 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
| RE44751, |
Sep 18 2009 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |