Patent
   D766753
Priority
Mar 20 2015
Filed
Jun 11 2015
Issued
Sep 20 2016
Expiry
Sep 20 2031
Assg.orig
Entity
unknown
15
3
n/a
The ornamental design for an optical measuring theodolite using light wave, as shown and described.

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side, top perspective view thereof; and,

FIG. 8 is a rear, left-side, top perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Ishii, Mitsuo, Aoki, Takeo

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Executed onAssignorAssigneeConveyanceFrameReelDoc
May 21 2015ISHII, MITSUOKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0358230257 pdf
May 21 2015AOKI, TAKEOKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0358230257 pdf
Jun 11 2015Kabushiki Kaisha Topcon(assignment on the face of the patent)
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