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The ornamental design for a three-dimensional measuring instrument, as shown.
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The article is a three-dimensional measuring instrument for lands, structures, vehicles, aircrafts and the like, wherein a laser beam scans on the objects.
In the perspective views of
Patent | Priority | Assignee | Title |
10324073, | Jan 16 2015 | Industrial Scientific Corporation | Modular gas monitoring system |
11408876, | Jan 16 2015 | Industrial Scientific Corporation | Modular gas monitoring system |
D581819, | Jun 19 2007 | TOPCON CORPORATION | Automatic leveling laser marking instrument |
D638318, | Mar 18 2010 | RIEGL LASER MEASUREMENT SYSTEMS GMBH | Laser scanner |
D708969, | Feb 01 2013 | Kabushiki Kaisha Topcon | Surveying instrument |
D723398, | Aug 06 2013 | Kabushiki Kaisha Topcon | Light wave distance measuring theodolite |
D723953, | Oct 07 2013 | Kabushiki Kaisha Topcon | Measuring device for measuring in three-dimension |
D766753, | Mar 20 2015 | Kabushiki Kaisha Topcon | Optical measuring thedolite using light wave |
D788624, | Jul 16 2015 | KONICA MINOLTA, INC. | Laser emitter/receiver |
D799993, | Jul 16 2015 | KONICA MINOLTA, INC. | Laser emitter/receiver |
D933507, | Jun 14 2019 | Measuring instrument for measuring magnetic fields | |
D980734, | Jan 15 2016 | Industrial Scientific Corporation | Gas monitoring device |
ER6035, | |||
ER7355, | |||
ER7607, | |||
ER9240, | |||
RE44112, | Sep 18 2009 | RIEGL LASER MEASUREMENT SYSTEMS GMBH | Laser scanner |
RE44751, | Sep 18 2009 | RIEGL LASER MEASUREMENT SYSTEMS GMBH | Laser scanner |
Patent | Priority | Assignee | Title |
D504831, | Jun 02 2004 | Black & Decker Inc | Laser level |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Apr 23 2007 | ISHII, MITSUO | Kabushiki Kaisha Topcon | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 019325 | /0867 | |
Apr 30 2007 | Kabushiki Kaisha Topcon | (assignment on the face of the patent) | / |
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