FIG. 1 is a perspective view of a first embodiment of a laser scanner constructed in accordance with the invention;
FIG. 2 is a front elevational view of the 1 laser scanner shown in FIG. 1, the rear elevational view being identical to the front elevational view;
FIG. 3 is a side elevational view of the laser scanner shown in FIG. 1;
FIG. 4 is a top plan view of the laser scanner shown in FIG. 1;
FIG. 5 is a perspective view of a second embodiment of a laser scanner constructed in accordance with the invention;
FIG. 6 is a front elevational view of the laser scanner shown in FIG. 5, the rear elevational view being identical to the front elevational view;
FIG. 7 is a side elevational view of the laser scanner shown in FIG. 5; and,
FIG. 8 is a top plan view of the laser scanner shown in FIG. 5.
Patent |
Priority |
Assignee |
Title |
2220884, |
|
|
|
4676598, |
May 15 1985 |
Trimble Navigation Limited |
Multiple reference laser beam apparatus |
4772875, |
May 16 1986 |
E T M REALTY TRUST |
Intrusion detection system |
4830489, |
Aug 20 1986 |
Trimble Navigation Limited |
Three dimensional laser beam survey system |
5144486, |
Oct 01 1990 |
Trimble Navigation Limited |
Laser beam apparatus for providing multiple reference beams |
5686996, |
May 25 1995 |
Advanced Micro Devices, INC |
Device and method for aligning a laser |
8290618, |
Mar 05 2007 |
Inos Automationssoftware GmbH |
Determining positions |
20120170029, |
|
|
|
D375464, |
Oct 21 1994 |
Sokkia Co., Ltd. |
Electronic theodolite for distance measuring |
D509761, |
Nov 11 2002 |
Stabila-Messgerate Gustav Ullrich GmbH |
Laser level |
D528022, |
Dec 28 2004 |
Stabila Messgerate Gustav Ulrich GmbH |
Laser measuring device |
D563247, |
Oct 30 2006 |
Kabushiki Kaisha Topcon |
Three-dimensional measuring instrument |
D587148, |
Sep 04 2007 |
Kabushiki Kaisha Topcon |
Laser sensor for machine control system |
D609124, |
Apr 28 2009 |
Kabushiki Kaisha Topcon |
Rotating laser |
D612753, |
Oct 30 2008 |
Kabushiki Kaisha Topcon |
Rotating laser |
D635038, |
Feb 19 2010 |
Kabushiki Kaisha Topcon |
Rotating laser |
D642485, |
Mar 18 2010 |
RIEGL LASER MEASUREMENT SYSTEMS GMBH |
Laser scanner |
EM17627820001, |
|
|
|
EM17627820002, |
|
|
|
EM19182510001, |
|
|
|
Date |
Maintenance Schedule |
Apr 02 2016 | 4 years fee payment window open |
Oct 02 2016 | 6 months grace period start (w surcharge) |
Apr 02 2017 | patent expiry (for year 4) |
Apr 02 2019 | 2 years to revive unintentionally abandoned end. (for year 4) |
Apr 02 2020 | 8 years fee payment window open |
Oct 02 2020 | 6 months grace period start (w surcharge) |
Apr 02 2021 | patent expiry (for year 8) |
Apr 02 2023 | 2 years to revive unintentionally abandoned end. (for year 8) |
Apr 02 2024 | 12 years fee payment window open |
Oct 02 2024 | 6 months grace period start (w surcharge) |
Apr 02 2025 | patent expiry (for year 12) |
Apr 02 2027 | 2 years to revive unintentionally abandoned end. (for year 12) |