Patent
   D778745
Priority
Apr 24 2015
Filed
Aug 20 2015
Issued
Feb 14 2017
Expiry
Feb 14 2032
Assg.orig
Entity
unknown
7
1
n/a
The ornamental design for an optical measuring theodolite using light wave, as shown and described.

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side perspective view thereof; and,

FIG. 8 is a rear, left-side perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Ishii, Mitsuo

Patent Priority Assignee Title
D834968, Dec 21 2016 TOPCON CORPORATION Light wave distance measuring theodolite
D834969, Dec 21 2016 TOPCON CORPORATION Light wave distance measuring theodolite
D843860, Nov 09 2016 Leica Geosystems AG Surveying instrument
D844468, Nov 09 2016 Leica Geosystems AG Case for surveying instrument
D845794, Nov 09 2016 Leica Geosystems AG Surveying instrument
D873158, Nov 09 2016 Leica Geosystems AG Surveying instrument
D971037, Jan 29 2021 Surveying instrument
Patent Priority Assignee Title
D723953, Oct 07 2013 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 28 2015ISHII, MITSUOKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0408860889 pdf
Aug 20 2015Kabushiki Kaisha Topcon(assignment on the face of the patent)
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