Patent
   D777588
Priority
Jun 23 2015
Filed
Sep 28 2015
Issued
Jan 31 2017
Expiry
Jan 31 2032
Assg.orig
Entity
unknown
15
4
n/a
The ornamental design for an optical measuring theodolite using light wave, as shown and described.

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof

FIG. 7 is a front, right-side, top perspective view thereof; and,

FIG. 8 is a rear, left-side, top perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Ishii, Mitsuo, Aoki, Takeo

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10324073, Jan 16 2015 Industrial Scientific Corporation Modular gas monitoring system
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Patent Priority Assignee Title
8897482, Feb 12 2008 Trimble AB Stereo photogrammetry from a single station using a surveying instrument with an eccentric camera
D684068, Sep 22 2011 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
D684069, Sep 22 2011 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
D723953, Oct 07 2013 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 25 2015AOKI, TAKEOKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0366700795 pdf
Sep 25 2015ISHII, MITSUOKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0366700795 pdf
Sep 28 2015Kabushiki Kaisha Topcon(assignment on the face of the patent)
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