Patent
   D766754
Priority
Apr 03 2015
Filed
Jun 11 2015
Issued
Sep 20 2016
Expiry
Sep 20 2031
Assg.orig
Entity
unknown
11
16
n/a
The ornamental design for an optical measuring theodolite using light wave, as shown and described.

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side, top perspective view thereof; and,

FIG. 8 is a rear, left-side, top perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Aoki, Takeo

Patent Priority Assignee Title
10324073, Jan 16 2015 Industrial Scientific Corporation Modular gas monitoring system
11408876, Jan 16 2015 Industrial Scientific Corporation Modular gas monitoring system
D834968, Dec 21 2016 TOPCON CORPORATION Light wave distance measuring theodolite
D834969, Dec 21 2016 TOPCON CORPORATION Light wave distance measuring theodolite
D843860, Nov 09 2016 Leica Geosystems AG Surveying instrument
D844468, Nov 09 2016 Leica Geosystems AG Case for surveying instrument
D845794, Nov 09 2016 Leica Geosystems AG Surveying instrument
D873158, Nov 09 2016 Leica Geosystems AG Surveying instrument
D980734, Jan 15 2016 Industrial Scientific Corporation Gas monitoring device
ER7607,
ER9240,
Patent Priority Assignee Title
6354010, May 23 1998 Asahi Kogaku Kogyo Kabushiki Kaisha Surveying instrument
6492806, Jun 14 2000 PENTAX Corporation Magnetic encoder and survey instrument having magnetic encoder
7200945, Jul 30 2004 SOKKIA CO , LTD Surveying instrument
7764809, Mar 08 2004 Kabushiki Kaisha Topcon Surveying method and surveying instrument
8264672, Jun 12 2009 Sprint Communications Company L.P. Visually determining Fresnel zone boundaries in a device
D409507, Jun 11 1998 Kabushiki Kaisha Topcon Electro-optical distance-measuring instrument
D494074, Sep 12 2003 Kabushiki Kaisha Topcon Optical measuring theodolite
D526223, Oct 19 2004 Kabushiki Kaisha Topcon Laser measuring instrument
D526588, Sep 10 2004 Trimble AB Surveying device
D531921, Feb 17 2005 TOPCON CORPORATION Portion of electronic theodolite
D558075, Apr 21 2006 Kabushiki Kaisha Topcon Laser transit
D576062, Jun 29 2006 PENTAX Corporation; PENTAX Industrial Instruments Co., Ltd. Total station
D605959, Jul 23 2008 Leica Geosystems AG Land surveying total station measuring device
D684068, Sep 22 2011 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
D684069, Sep 22 2011 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
D723953, Oct 07 2013 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension
//
Executed onAssignorAssigneeConveyanceFrameReelDoc
May 21 2015AOKI, TAKEOKabushiki Kaisha TopconASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0358230189 pdf
Jun 11 2015Kabushiki Kaisha Topcon(assignment on the face of the patent)
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule