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					| Patent    D781731 |  
					| Priority Jun 10 2015 |  
					| Filed Nov 02 2015 |  
					| Issued Mar 21 2017 |  
					| Expiry Mar 21 2032 |  
					|  |  
					| Assg.orig |  
					|  |  
					| Entity unknown |  
					 | 14 |  
					 | 4 |  
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			  The ornamental design for an optical measuring theodolite using light wave, as shown and described. | 
 
	
FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a left-side elevational view thereof;
FIG. 4 is a right-side elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a front, right-side perspective view thereof; and,
FIG. 8 is a rear, left-side perspective view thereof.
The broken lines depict environmental subject matter only and form no part of the claimed design.
	
	Ishii, Mitsuo, Nakamura, Satoshi
	
	
	  
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	 | ER7607, |  |  |  | 
    
	 | ER9240, |  |  |  | 
	
	
	
	
	
	
	
	  
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