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Patent
   D444720
Priority
Jul 31 2000
Filed
Jul 31 2000
Issued
Jul 10 2001
Expiry
Jul 10 2015
Inventors
Campbell, …
Assg.orig
LeCroy Cor…
Assg.curr
TELEDYNE L…
Entity
unknown
Referenced by
9
References
2
Maint.:
n/a
The ornamental design for a notched electrical test probe tip, as shown and described.

FIG. 1 is a general perspective view of a notched electrical test probe tip showing the new design, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 2 is a front view of the notched electrical test probe tip, the back view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 3 is a right side view of the notched electrical test probe tip, the left side view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 4 is a top view of the notched electrical test probe tip; and,

FIG. 5 is a bottom view of the notched electrical test probe tip.
INVENTORS:

Campbell, Julie A.

THIS PATENT IS REFERENCED BY THESE PATENTS:
Patent Priority Assignee Title
10119992, Apr 01 2015 Tektronix, Inc High impedance compliant probe tip
6846735, Sep 05 2002 Bridge Semiconductor Corporation Compliant test probe with jagged contact surface
7671613, Jan 06 2006 TELEDYNE LECROY, INC Probing blade conductive connector for use with an electrical test probe
8098078, Jan 06 2006 TELEDYNE LECROY, INC Probing blade with conductive connector for use with an electrical test probe
9140724, Jan 06 2006 TELEDYNE LECROY, INC Compensating resistance probing tip optimized adapters for use with specific electrical test probes
9253894, Feb 11 2005 WINTEC INDUSTRIES, INC Electronic assembly with detachable components
9404940, Jan 06 2006 TELEDYNE LECROY, INC Compensating probing tip optimized adapters for use with specific electrical test probes
9810715, Dec 31 2014 Tektronix, Inc High impedance compliant probe tip
D942290, Jul 12 2019 Johnstech International Corporation Tip for integrated circuit test pin
THIS PATENT REFERENCES THESE PATENTS:
Patent Priority Assignee Title
D400811, Nov 21 1997 Delaware Capital Formation, Inc Test probe plunger tip
D422518, Apr 15 1999 Power Products, LLC Electrical instrument probe tip
ASSIGNMENT RECORDS    Assignment records on the USPTO
///////////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 31 2000LeCroy Corporation(assignment on the face of the patent)
Aug 22 2000CAMPBELL, JULIE A LeCroy CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0111660669 pdf
Sep 30 2003LeCroy CorporationLeCroy CorporationCHANGE OF ADDRESS0140150783 pdf
Oct 29 2004LeCroy CorporationBANK OF NEW YORK, THE, AS ADMINISTRATIVE AGENTGRANT OF SECURITY INTEREST0153550270 pdf
Mar 30 2007LeCroy CorporationMANUFACTURERS AND TRADERS TRUST COMPANYSECURITY AGREEMENT0193310239 pdf
Jul 29 2010LeCroy CorporationMANUFACTURERS AND TRADERS TRUST COMPANYSECURITY AGREEMENT0248920689 pdf
Aug 08 2011LeCroy CorporationRBS CITIZENS, N A , AS ADMINISTRATIVE AGENTSECURITY AGREEMENT0268260850 pdf
Aug 03 2012LeCroy CorporationTELEDYNE LECROY, INC MERGER SEE DOCUMENT FOR DETAILS 0291620724 pdf
Aug 22 2012RBS CITIZENS, N A TELEDYNE LECROY, INC RELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS 0291550478 pdf
Oct 09 2012MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENTLeCroy CorporationRELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS 0291280280 pdf
Oct 18 2012JP MORGAN CHASE BANK, N A AS ADMINISTRATIVE AGENT SUCCESSOR ADMINISTRATIVE AGENT TO THE BANK OF NEW YORKLeCroy CorporationRELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS 0293280042 pdf
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