Patent
   D460702
Priority
Apr 09 2001
Filed
Apr 09 2001
Issued
Jul 23 2002
Expiry
Jul 23 2016
Assg.orig
Entity
unknown
9
5
n/a
The ornamental design for a circuit tester, as shown and described.

FIG. 1 is a plane view of a circuit tester showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view of thereof

FIG. 4 is a bottom plane view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a plane view, in which the testing rod is separated from the main body section; and,

FIG. 8 is a perspective elevational view thereof.

Kaise, Hideo

Patent Priority Assignee Title
D481963, May 31 2002 HIOKI DENKI KABUSHIKI KAISHA Digital multi-meter
D565444, Jan 29 2007 General Electric Company Testing device for acoustic probes and systems
D625211, Feb 02 2010 Handheld voltage detector with flashlight
D634228, Nov 03 2009 Johnstech International Electrical pin used in integrated circuit test sockets
D637926, Feb 02 2010 Voltage detector with bar graph indicator
D663635, Sep 07 2010 Johnstech International Corporation Electrical contact pin
D713273, Apr 29 2013 ULTA-LIT TREE CO Light string diagnostic and repair device
D947694, Aug 09 2019 Pokit Innovations Pty Ltd Electronic measurement device
D981351, Sep 26 2022 SHENZHEN SINOY TECHNOLOGY CO., LTD; SHENZHEN SINOY TECHNOLOGY CO , LTD Electric circuit tester
Patent Priority Assignee Title
D260618, Nov 08 1978 Electrical testing instrument
D288179, Apr 23 1984 SOAR CORPORATION, A CORP OF JAPAN Digital multimeter
D289617, Jun 06 1984 Shiojiri Kogyo Kabushiki Kaisha Multimeter
D367431, Jan 31 1994 Seiko Epson Corporation Voltmeter
D400454, May 09 1997 Societe Chauvin Arnoux Voltage tester
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Mar 27 2001KAISE, HIDEOKaise Kabushiki KaishaASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0117390513 pdf
Apr 09 2001Kaise Kabushiki Kaisha(assignment on the face of the patent)
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