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The ornamental design for a circuit tester, as shown and described.
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FIG. 1 is a plane view of a circuit tester showing my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view of thereof
FIG. 4 is a bottom plane view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a plane view, in which the testing rod is separated from the main body section; and,
FIG. 8 is a perspective elevational view thereof.
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| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Mar 27 2001 | KAISE, HIDEO | Kaise Kabushiki Kaisha | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 011739 | /0513 | |
| Apr 09 2001 | Kaise Kabushiki Kaisha | (assignment on the face of the patent) | / |
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