The ornamental design for an electricalpin used in integrated circuit test sockets, as shown and described.
FIG. 1 is a perspective view of the ornamental design for an electrical pin used in integrated circuit test sockets.
FIG. 2 is a side view thereof.
FIG. 3 is a back view thereof.
FIG. 4 is a perspective view thereof an alternate embodiment.
FIG. 5 is a side view of the subject matter of FIG. 4; and,
FIG. 6 is a bottom view thereof the subject matter of FIG. 4.
The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.