Electrical pin used in integrated circuit test sockets

Abstract

Description

FIG. 1 is a perspective view of the ornamental design for an electrical pin used in integrated circuit test sockets.

FIG. 2 is a side view thereof.

FIG. 3 is a back view thereof.

FIG. 4 is a perspective view thereof an alternate embodiment.

FIG. 5 is a side view of the subject matter of FIG. 4; and,

FIG. 6 is a bottom view thereof the subject matter of FIG. 4.

The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.

Claims

The ornamental design for an electrical pin used in integrated circuit test sockets, as shown and described.