Patent
   D567124
Priority
Feb 02 2007
Filed
Feb 02 2007
Issued
Apr 22 2008
Expiry
Apr 22 2022
Assg.orig
Entity
unknown
2
6
n/a
The ornamental design of a front panel for measurement instruments, as shown and described.

The ornamental design disclosed in this application is for various embodiments of a front panel for measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like.

FIG. 1 is a perspective view of a first embodiment of front panel for measurement instruments;

FIG. 2 is a front elevation view of the first embodiment of front panel for measurement instruments;

FIG. 3 is a left side elevation view of the first embodiment of front panel for measurement instruments;

FIG. 4 is a right side elevation view of the first embodiment of front panel for measurement instruments;

FIG. 5 is a top plan view of the first embodiment of front panel for measurement instruments;

FIG. 6 is a bottom plan view of the first embodiment of front panel for measurement instruments;

FIG. 7 is a perspective view of a second embodiment of front panel for measurement instruments;

FIG. 8 is a front elevation view of the second embodiment of front panel for measurement instruments;

FIG. 9 is a left side elevation view of the second embodiment of front panel for measurement instruments;

FIG. 10 is a right side elevation view of the second embodiment of front panel for measurement instruments;

FIG. 11 is a top plan view of the second embodiment of front panel for measurement instruments;

FIG. 12 is a bottom plan view of the second embodiment of front panel for measurement instruments;

FIG. 13 is a perspective view of a third embodiment of front panel for measurement instruments;

FIG. 14 is a front elevation view of the third embodiment of front panel for measurement instruments;

FIG. 15 is a left side elevation view of the third embodiment of front panel for measurement instruments;

FIG. 16 is a right side elevation view of the third embodiment of front panel for measurement instruments;

FIG. 17 is a top plan view of the third embodiment of front panel for measurement instruments; and,

FIG. 18 is a bottom plan view of third embodiment of front panel for measurement instruments.

The front panel has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, first beveled surfaces extending from side and top surfaces and from a first portion of a bottom surface to the rectangular front face, and a second beveled surface extending from a second portion of the bottom surface to the rectangular front face with the second beveled surface laterally transitioning from the first beveled surface.

Nelson, Michael D., Orr, David K.

Patent Priority Assignee Title
D603316, Sep 24 2008 E V POWER SYSTEMS, INC System control panel
D671021, May 05 2011 Tektronix, Inc RF input/output connector receptacle and control buttons for a measurement instrument
Patent Priority Assignee Title
6140812, Jun 18 1998 Tektronix, Inc.; Tektronix, Inc Electronic instrument with multiple position spring detented handle
6731104, Dec 05 2002 Tektronix, Inc.; Tektronix, Inc Measurement probe system with EOS/ESD protection
6982550, Apr 28 2004 Agilent Technologies, Inc. Unbreakable micro-browser
D332833, Jul 19 1990 I-Stat Corporation Portable clinical diagnostic instrument
D420607, Apr 09 1999 Tektronix, Inc. Front panel for a measurement instrument
D508426, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jan 29 2007NELSON, MICHAEL D Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0188650780 pdf
Jan 29 2007ORR, DAVID K Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0188650780 pdf
Feb 02 2007Tektronix, Inc.(assignment on the face of the patent)
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